Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983

A.G. Cullis (Autor)

Buch | Hardcover

300 Seiten

1983
IOP Publishing Ltd (Verlag)
9780854981588 (ISBN)

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This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

A. G. Cullis (Author) , S. M. Davidson (Edited by) , G. R. Booker (Edited by)

Section 1 Structure and properties of dislocations, Section 2 High resolution microscopy, Section 3 Transient annealing phenomena, Section 4 Silicon characterisation, Section 5 Compund semiconductor characterization, Section 6 Scanning EBIC and CL, Section 7 X-ray techniques, Section 8 Non-conventional microscopy, Section 9 Device assement by scanning microscopy, Section 10 Device assessment by transmisison microscopy.

Erscheint lt. Verlag	1.1.1983
Verlagsort	Bristol
Sprache	englisch
Maße	156 x 234 mm
Gewicht	1088 g
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
Themenwelt	Technik ► Maschinenbau
ISBN-13	9780854981588 / 9780854981588
Zustand	Neuware