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Electron Microscopy of Polymers

Goerg H. Michler (Autor)

Buch | Hardcover

XX, 473 Seiten

2008
Springer Berlin (Verlag)
9783540363507 (ISBN)

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There are many books on electron microscopy, however, the study of polymers using EM necessitates special techniques, precautions and preparation methods, including ultramicrotomy. This book discusses the general characteristics of the various techniques of EM, including scanning force microscopy (AFM). The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Techniques of Electron Microscopy.- Overview of Techniques.- Transmission Electron Microscopy: Fundamentals of Methods and Instrumentation.- Transmission Electron Microscopy: Conventional and Special Investigations of Polymers.- Scanning Electron Microscopy (SEM).- Atomic Force Microscopy.- In Situ Microscopy.- Image Processing and Image Analysis.- Preparation Techniques.- Problems Associated with the Electron Microscopy of Polymers.- Preparation of Surfaces.- Preparation of Thin Sections: (Cryo)ultramicrotomy and (Cryo)microtomy.- Special Preparation Techniques.- Preparation for (In Situ) Deformation Tests.- Contrast Enhancement.- Main Groups of Polymers.- Structural Hierarchy of Polymers.- Amorphous Polymers.- Semicrystalline Polymers.- Polymer Blends.- High-Impact Rubber-Modified Polymers.- Block Copolymers.- Rubbers and Elastomers.- Polymer Composites.- Polymer Nanocomposites.- Biomaterials.- Special Processing Forms.

Erscheint lt. Verlag	23.7.2008
Reihe/Serie	Springer Laboratory
Zusatzinfo	XX, 473 p.
Verlagsort	Berlin
Sprache	englisch
Maße	127 x 203 mm
Gewicht	806 g
Themenwelt	Naturwissenschaften ► Chemie ► Organische Chemie
Themenwelt	Technik ► Maschinenbau
Schlagworte	Copolymer • Elastomer • electron microscopy • Elektronenmikroskopie • Morphology • Polymer • Polymere • polymer morphology • Scanning Force Microscopy • structure property correlations • Thin section • Transmission Electron Microscopy
ISBN-13	9783540363507 / 9783540363507
Zustand	Neuware