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Guide To Characteristics And Characterization Of Semiconductor Surfaces - Jerzy Ruzyllo

Guide To Characteristics And Characterization Of Semiconductor Surfaces

(Autor)

Buch | Hardcover
220 Seiten
2025
World Scientific Publishing Co Pte Ltd (Verlag)
978-981-12-5481-9 (ISBN)
CHF 139,65 inkl. MwSt
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This comprehensive compendium explores aspects of semiconductor surface characteristics and characterization from the perspective of applied semiconductor device research and process development, rather than an in-depth coverage of surface science related issues. It provides guidance to the features of semiconductor surfaces affecting performance of the practical semiconductor devices, as well as selection of methods used to characterize those features.Based on the author's over thirty years of research and graduate advising in semiconductor surface processing and characterization, this unique reference text addresses the needs of graduate students, researchers and industry professionals who are familiar with semiconductor engineering and would like to learn about the practical aspects of semiconductor surface characteristics, processing techniques, and characterization methods used in device process development, process diagnostics and monitoring.
Erscheinungsdatum
Verlagsort Singapore
Sprache englisch
Themenwelt Technik Elektrotechnik / Energietechnik
ISBN-10 981-12-5481-8 / 9811254818
ISBN-13 978-981-12-5481-9 / 9789811254819
Zustand Neuware
Informationen gemäß Produktsicherheitsverordnung (GPSR)
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