Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques
12th International Conference, STM'03
Seiten
2003
American Institute of Physics
9780735401686 (ISBN)
American Institute of Physics
9780735401686 (ISBN)
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Discusses developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology.
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.
| Erscheint lt. Verlag | 27.1.2004 |
|---|---|
| Reihe/Serie | AIP Conference Proceedings ; 696 |
| Verlagsort | New York |
| Sprache | englisch |
| Maße | 162 x 234 mm |
| Gewicht | 540 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Mechanik |
| Technik | |
| ISBN-13 | 9780735401686 / 9780735401686 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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