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Characterization and Metrology for ULSI Technology 2003

2003 International Conference on Characterization and Metrology for Ulsi Technology
Buch | Hardcover
836 Seiten
2003
American Institute of Physics (Verlag)
978-0-7354-0152-5 (ISBN)
CHF 399,95 inkl. MwSt
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The worldwide semiconductor community faces increasingly difficult challenges as it moves into the manufacturing of chips with feature sizes approaching 100 nm and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Topics include: integrated circuit history, challenges and overviews, front end, lithography, interconnect and back end, and critical analytical techniques. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continue the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics.The editors believe that this book of collected papers provides a concise and effective portrayal of industry characterization needs and the way they are being addressed by industry, academia, and government to continue the dramatic progress in semiconductor technology.
Hopefully, it will also provide a basis for stimulating advances in metrology and new ideas for research and development.
Erscheint lt. Verlag 4.11.2003
Reihe/Serie AIP Conference Proceedings ; 683
Zusatzinfo Illustrations
Verlagsort New York
Sprache englisch
Maße 216 x 279 mm
Gewicht 2140 g
Einbandart gebunden
Themenwelt Naturwissenschaften Physik / Astronomie Mechanik
Technik Elektrotechnik / Energietechnik
ISBN-10 0-7354-0152-7 / 0735401527
ISBN-13 978-0-7354-0152-5 / 9780735401525
Zustand Neuware
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