Introduction to Semiconductor Device Yield Modeling

Albert V.Ferris- Prabhu (Autor)

Buch | Hardcover

108 Seiten

1992
Artech House Publishers (Verlag)
978-0-89006-450-4 (ISBN)

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This text, the first of its kind, delivers a systematically organized introduction to the theory and practice of yield prediction. The book addresses the economic need for accurate yield prediction, and clarifies the important role it plays in the semiconductor industry.

Yield. Fault Probability. Effect of Defect Sizes on the Fault Probability. Counting Techniques. Yield Equations. Defect Density and Scaling Rules. Yield Prediction. Yield With Redundancy. A Yield Comparison. Productivity. Conclusion. References.

Erscheint lt. Verlag	31.7.1992
Reihe/Serie	Electronic Materials & Devices Library
Zusatzinfo	black & white illustrations
Verlagsort	Norwood
Sprache	englisch
Maße	152 x 229 mm
Gewicht	332 g
Themenwelt	Technik ► Elektrotechnik / Energietechnik
Themenwelt	Technik ► Maschinenbau
ISBN-10	0-89006-450-4 / 0890064504
ISBN-13	978-0-89006-450-4 / 9780890064504
Zustand	Neuware