Combined Analysis

D Chateigner (Autor)

Software / Digital Media

496 Seiten

2013
John Wiley & Sons Inc (Hersteller)
9781118622506 (ISBN)

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This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.

Daniel Chateigner is Professor at the University of Caen Lower Normandy in France.

Erscheint lt. Verlag	7.3.2013
Verlagsort	New York
Sprache	englisch
Maße	150 x 250 mm
Gewicht	28 g
Themenwelt	Technik ► Elektrotechnik / Energietechnik
ISBN-13	9781118622506 / 9781118622506
Zustand	Neuware