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Epioptics 2000 - Proceedings Of The 19th Course Of The International School Of Solid State Physics -

Epioptics 2000 - Proceedings Of The 19th Course Of The International School Of Solid State Physics

Antonio Cricenti (Herausgeber)

Buch | Hardcover
152 Seiten
2001 | 2000 ed.
World Scientific Publishing Co Pte Ltd (Verlag)
978-981-02-4771-3 (ISBN)
CHF 148,35 inkl. MwSt
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The proceedings of a workshop which brought together researchers who work in the fields of surface science, epitaxial growth, materials deposition and optical diagnostics relevant to (semiconductor) materials and structures of interest for present and anticipated (spin) electronic devices.
This is the proceedings of a workshop which brought together researchers from universities and research institutes who work in the fields of (semiconductor) surface science, epitaxial growth, materials deposition and optical diagnostics relevant to (semiconductor) materials and structures of interest for present and anticipated (spin) electronic devices. The workshop assessed the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and examined the usefulness of these techniques for optimization of high quality multilayer samples through feedback control during materials growth and processing.

Optical properties of excitons in semiconductor quantum wells and microcavities, L.C. Andreani; optical properties of semiconductor surfaces, G. Chiarotti et al; measurements of second-order optical susceptibility in crystalline and porous silicon, M. Falasconi et al; giant bilayer haemoglobin from earthworm studied by X-ray absorption spectroscopy and atomic force microscopy, M. Girasole et al; SNOM and spectroscopy - a technique beyond the diffraction limit, V. Marocchi and A. Cricenti; theory of second harmonic generation at semiconductor surfaces, B.S. Mendoza; differential reflectivity and angle resolved photoemission of PbS(100), M. Tallarida et al; deep-level defects at a lattice-mismatched InGaAs/GaAs interface, O. Yastrubchak et al; and other papers.

Erscheint lt. Verlag 12.11.2001
Reihe/Serie The Science And Culture Series - Materials Science
Verlagsort Singapore
Sprache englisch
Themenwelt Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik Maschinenbau
ISBN-10 981-02-4771-0 / 9810247710
ISBN-13 978-981-02-4771-3 / 9789810247713
Zustand Neuware
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