Advanced Analytical Methods in Tribology

Martin Dienwiebel, Maria-Isabel De Barros Bouchet (Herausgeber)

Buch | Hardcover

XIV, 328 Seiten

2018
Springer International Publishing (Verlag)
978-3-319-99896-1 (ISBN)

Artikel merken

This book presents the basics and methods of nanoscale analytical techniques for tribology field. It gives guidance to the application of mechanical, microstructural, chemical characterization methods and topography analysis of materials. It provides an overview of the of state-of-the-art for researchers and practitioners in the field of tribology. It shows different examples to the application of mechanical, microstructural, chemical characterization methods and topography analysis of materials. Friction and Wear phenomena are governed by complexe processes at the interface of sliding surfaces. For a detailed understanding of these phenomena many surface sensitive techniques have become available in recent years. The applied methods are atom probe tomography, in situ TEM, SERS, NEXAFS, in situ XPS, nanoindentation and in situ Raman spectroscopy. A survey of new related numerical calculations completes this book. This concerns ab-initio coupling, numerical calculations for mechanical aspects and density functional theory (DFT) to study chemical reactivity.

Martin Dienwiebel studied Physics in Dortmund and Bonn, Germany and conducted his Master thesis research in the field of low temperature STM at the National Research Center Juelich. He obtained his PhD in the field of friction force microscopy and Superlubricity at Leiden University, The Netherlands. During his PhD research he also spent nine months at Tokyo Institute of Technology in the group of Prof. Takayanagi.

Introduction.- Microstructural Characterization.- Chemical Characterization.- Mechanical Characterization.- Topography Analysis.- Numerical Calculations.

Erscheinungsdatum	18.10.2018
Reihe/Serie	Microtechnology and MEMS
Zusatzinfo	XIV, 328 p. 171 illus., 103 illus. in color.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Gewicht	673 g
Themenwelt	Technik ► Maschinenbau
Schlagworte	Atom probe tomography • atom probe tomography in tribology • EXAFS/XANES • in situ Raman technique • in-situ topography • in-situ XPS • lubrication science • molecular dynamics coupling • Nanoindentation • Nanotribology • numerical calculations in tribology • topography analysis of materials • tribochemical reactions
ISBN-10	3-319-99896-X / 331999896X
ISBN-13	978-3-319-99896-1 / 9783319998961
Zustand	Neuware