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Monatomic Two-Dimensional Layers

Modern Experimental Approaches for Structure, Properties, and Industrial Use

Buch | Softcover

232 Seiten

2018
Elsevier Science Publishing Co Inc (Verlag)
978-0-12-814160-1 (ISBN)

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Monatomic Two-Dimensional Layers: Properties, Fabrication and Industrial Applications provides a detailed examination on basic principles and state-of-the-art experimental techniques for monatomic layers on model surfaces, and in operating devices. Both conventional surface science and novel 2D materials science are included. The reader is guided through an introduction to the basic science of the field that is followed by advanced science specific to the system. Characterization techniques, the principles of state-of-the-art instruments for monatomic layers, and topics, including positron diffraction, time-resolved photoemission spectroscopy, surface transport measurements, and operando nanospectroscopy are also covered.

Researchers, graduate students and professionals will find this volume invaluable to acquire a deeper knowledge of the basic science, preparation, and experimental characterization techniques for 2D materials. Industrial technicians and operators will find it a useful overview of surface science related methods for fabrication and characterization of 2D materials.

is Associate Professor at the Institute for Solid State Physics, University of Tokyo, Japan. His research interests are in the fields of spectroscopy physics and surface science. He has previously edited the Journal of the Surface Science Society of Japan and is currently writing a Japanese textbook entitled Material and Physics by Quantum Beams

1. Basics and Families of Monatomic Layers: Single-Layer 2D Materials
2. Surface Science: Single Atomic Layers on Crystal Surfaces
3. Interplay of Two Dimensional Lattices of Atomic Layers at the Junction
4. Diffraction: Determination of Atomic Structure
5. Advanced Photoelectron Spectroscopies
6. Transport Measurement: Carrier Transport
7. Operando Soft X-Ray Spectromicroscopic Measurement and the Use for High-Performance Devices and Circuits

Erscheinungsdatum	18.09.2018
Reihe/Serie	Micro & Nano Technologies
Sprache	englisch
Maße	191 x 235 mm
Gewicht	520 g
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
Themenwelt	Technik ► Maschinenbau
ISBN-10	0-12-814160-3 / 0128141603
ISBN-13	978-0-12-814160-1 / 9780128141601
Zustand	Neuware