Tolerance Analysis of Electronic Circuits Using MATHCAD
Seiten
2018
CRC Press (Verlag)
978-1-138-42246-9 (ISBN)
CRC Press (Verlag)
978-1-138-42246-9 (ISBN)
MATHCAD offers the same opportunities for effective tolerance analysis as its MATLAB counterpart. Written for the practicing electronics professional, this book offers a comprehensive, step-by-step treatment of methods used to perform analyses useful to the design process of circuit cards and systems of cards.
Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATHCAD offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:
worst-case analysis,
limits for production testing,
component stress analysis,
determining if a design meets specification limits, and
manufacturing yield analysis
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATHCAD offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:
worst-case analysis,
limits for production testing,
component stress analysis,
determining if a design meets specification limits, and
manufacturing yield analysis
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
Boyd, Robert
INTRODUCTION, PART 1: Root-Sum-Square and Extreme Value Analysis, PART 2: Monte Carlo Analysis, PART 3: Advanced Topics, APPENDIX, REFERENCES
| Erscheinungsdatum | 06.05.2018 |
|---|---|
| Verlagsort | London |
| Sprache | englisch |
| Maße | 129 x 198 mm |
| Gewicht | 560 g |
| Themenwelt | Technik ► Elektrotechnik / Energietechnik |
| Technik ► Umwelttechnik / Biotechnologie | |
| ISBN-10 | 1-138-42246-0 / 1138422460 |
| ISBN-13 | 978-1-138-42246-9 / 9781138422469 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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