VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh (Herausgeber)

Buch | Softcover

815 Seiten

2017 | 1st ed. 2017
Springer Verlag, Singapore
978-981-10-7469-1 (ISBN)

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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.

Erscheinungsdatum	23.01.2018
Reihe/Serie	Communications in Computer and Information Science ; 711
Zusatzinfo	486 Illustrations, black and white
Verlagsort	Singapore
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Mathematik / Informatik ► Informatik ► Netzwerke
	Mathematik / Informatik ► Informatik ► Theorie / Studium
	Informatik ► Weitere Themen ► Hardware
	Technik ► Elektrotechnik / Energietechnik
Schlagworte	Applications • Computer Science • conference proceedings • Informatics • Research
ISBN-10	981-10-7469-0 / 9811074690
ISBN-13	978-981-10-7469-1 / 9789811074691
Zustand	Neuware