Digital Circuit Testing
A Guide to DFT and Other Techniques
Seiten
1991
Academic Press Inc (Verlag)
978-0-12-734580-2 (ISBN)
Academic Press Inc (Verlag)
978-0-12-734580-2 (ISBN)
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Technological advances in the electronics industry have made it difficult to access test nodes. New testing methods are needed and increasingly emphasis is placed on the development of such methods. This book provides an introduction to these and other testing techniques.
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
A Test Generation Method Using Testability Results. Circuit ATVG and DFT. PLD Design for Test. Built-In Self Test and Boundary Scan Techniques. ATE and the Testing Process. Special Testing Topics and Conclusions. Index.
| Erscheint lt. Verlag | 29.8.1991 |
|---|---|
| Verlagsort | San Diego |
| Sprache | englisch |
| Maße | 159 x 235 mm |
| Gewicht | 600 g |
| Themenwelt | Technik ► Elektrotechnik / Energietechnik |
| Technik ► Maschinenbau | |
| ISBN-10 | 0-12-734580-9 / 0127345809 |
| ISBN-13 | 978-0-12-734580-2 / 9780127345802 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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