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Control of Semiconductor Interfaces

Proceedings of the First International Symposium, Karuizawa, Japan, 8-12 November 1993

I. Ohdomari, M. Oshima, A. Hiraki (Herausgeber)

Buch | Hardcover

600 Seiten

1994
Elsevier Science Ltd (Verlag)
9780444818898 (ISBN)

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These proceedings contain a selection of papers presented at a symposium on semiconductor interfaces. Topics covered include metal/silicon, semiconductor hetero-interface, characterization, semiconducting new materials, control of interface properties and contact metallization.

Plenary; metal/silicon; semiconductor hetero-interface; characterization (I); semiconducting new materials; metal/compound semiconductor; SiO2/Si; characterization (II); insulator/semiconductor; characterization (III); interface in device; control of interface formation - Si; control of interface properties - Si; contact metallization - Si; characterization - Si; control of interface formation - compound semiconductors; control of interface properties - compound semiconductors; contact metallization - compound semiconductors; characterization - compound semiconductors. (Part contents).

Erscheint lt. Verlag	31.5.1994
Zusatzinfo	index
Verlagsort	Oxford
Sprache	englisch
Themenwelt	Technik ► Elektrotechnik / Energietechnik
ISBN-13	9780444818898 / 9780444818898
Zustand	Neuware