Materials Characterization Using Nondestructive Evaluation (NDE) Methods
Woodhead Publishing Ltd (Verlag)
978-0-08-100040-3 (ISBN)
Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries.
Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress.
Dr. Gerhard Hübschen worked for more than 30 years at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany, in the department for “Materials characterization, defect detection and lifetime management Dr. Iris Altpeter worked for more than 30 years at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany, and was the head of the department for “Materials characterization, defect detection and lifetime management. Dr. Ralf Tschuncky has been a member of the department for materials characterization at the Fraunhofer Institute for Nondestructive Testing (IZFP), Germany for more than 15 years. Prof. Hans-Georg Herrmann holds the chair of Lightweight Systems at Saarland University, Germany, and is also head of the department “In-service Inspection & Life-cycle Monitoring and deputy director at the Fraunhofer IZFP.
1. Atomic force microscopy (AFM) for materials characterization
2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization
3. X-ray micro-tomography for materials characterization
4. X-ray diffraction (XRD) techniques for materials characterization
5. Microwave, millimeter wave and terahertz techniques for materials characterization
6. Acoustical microscopy for materials characterization
7. Ultrasonic techniques for materials characterization
8. Electromagnetic techniques for materials characterization
9. Hybrid methods for materials characterization
| Erscheinungsdatum | 12.04.2016 |
|---|---|
| Reihe/Serie | Woodhead Publishing Series in Electronic and Optical Materials |
| Verlagsort | Cambridge |
| Sprache | englisch |
| Maße | 152 x 229 mm |
| Gewicht | 720 g |
| Themenwelt | Technik ► Maschinenbau |
| ISBN-10 | 0-08-100040-5 / 0081000405 |
| ISBN-13 | 978-0-08-100040-3 / 9780081000403 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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