Transmission Electron Microscopy

Diffraction, Imaging, and Spectrometry

C. Barry Carter, David B. Williams (Herausgeber)

Buch | Hardcover

XXXIII, 518 Seiten

2016 | 1st ed. 2016
Springer International Publishing (Verlag)
978-3-319-26649-7 (ISBN)

Infos

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today's instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging-the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science

Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Autor

C. Barry Carter is the Editor-in-Chief of the Journal of Materials Science and a CINT Distinguished Affiliate Scientist. He teaches at UConn.David B. Williams is the Monte Ahuja Endowed Dean’s Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.

Inhalt

Foreword by Sir John Meurig Thomas.- 1. Electron Sources.- 2. In Situ and Operando.- 3. Electron Diffraction and Phase Identification.- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns.- 5. Electron crystallography, charge-density mapping and nanodiffraction.- 6. Digital Micrograph.- 7. Electron waves, interference & coherence.- 8. Electron Holography.- 9. Focal-Series Reconstruction.- 10. Direct Methods For Image Interpretation.- 11. Imaging in the STEM.- 12. Electron Tomography.- 13. Energy-Filtered Transmission Electron Microscopy.- 14. Calculation of Electron Energy-Loss Spectra.- 15. Electron Diffraction & X-Ray Excitation.- 16. X-Ray and Electron Energy-Loss Spectral Imaging.- 17. Practical Aspects and Advanced Applications of XEDS.

Rezensionen

"I would highly recommend this 'companion' volume for researchers and students of the materials and applied sciences; in fact, anybody using transmission electron microscopy in their research will extract many practical ideas ... . Because of the high quality of the photographic images, composite illustrations, and text presentations, I suggest that this book has a place on the shelf of any electron microscopy laboratory. ... The editors have put together a wonderful review volume that is well worth the read." (David C. Bell, Microscopy and Microanalysis, Vol. 24 (03), June, 2018)

"Transmission Electron Microscopy, a Textbook for Materials Science, first published in 1996 with a second edition in 2009, is a comprehensive book on the subject, with a quite original approach. ... The book was carefully designed for teaching purposes and its phenomenal success shows that this was time well spent." (Peter Hawkes, Journal of Materials Science, Vol. 52, 2017)

Produkt-Details

• Erscheinungsdatum: 24.05.2016
• Zusatzinfo: XXXIII, 518 p. 300 illus.
• Verlagsort: Cham
• Sprache: englisch
• Maße: 210 x 279 mm
• Gewicht: 1464 g
• Themenwelt: Technik ► Maschinenbau
• Schlagworte: Characterization and Evaluation of Materials • Chemistry and Materials Science • Continuum Mechanics and Mechanics of Materials • EELS • EFTEM • electron diffraction • electron holography • Electron Sources • Electron Tomography • Focal-series reconstruction • nanoscale science and technology • Operando TEM • Solid state physics • Spectroscopy and Microscopy • Spectroscopy/Spectrometry • Spectrum Imaging • TEM Textbook • Transmission Electron Microscopy • XEDS
• ISBN-10: 3-319-26649-7 / 3319266497
• ISBN-13: 978-3-319-26649-7 / 9783319266497
• Zustand: Neuware