Sub-100nm Cmos

Mark Bohr, John R. Hauser, Hiroshi Iwai, Scott E. Thompson, H.S. Philip Wong (Autoren)

VHS Video

2000
I.E.E.E.Press (Hersteller)
978-0-7803-6137-9 (ISBN)

Infos

This videotaped tutorial begins by reviewing historic trends in CMOS device scaling and identifying the characteristics and requirements of sub-100nm transistors, including both device and circuit considerations, and gate oxide scaling and scaling source/drain regions and optimizing well profiles.

Produkt-Details

• Erscheint lt. Verlag: 31.3.2000
• Verlagsort: Piscataway NJ
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• ISBN-10: 0-7803-6137-7 / 0780361377
• ISBN-13: 978-0-7803-6137-9 / 9780780361379
• Zustand: Neuware