Terrestrial Radiation Effects in ULSI Devices and Electronic Systems (eBook)

Eishi H. Ibe (Autor)

eBook Download: EPUB

2014 | 1. Auflage
296 Seiten
John Wiley & Sons (Verlag)
978-1-118-47932-2 (ISBN)

Infos

This book provides the reader with knowledge on a wide variety
of radiation fields and their effects on the electronic devices and
systems. The author covers faults and failures in ULSI devices
induced by a wide variety of radiation fields, including electrons,
alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers
will learn how to make numerical models from physical insights, to
determine the kind of mathematical approaches that should be
implemented to analyze radiation effects. A wide variety of
prediction, detection, characterization and mitigation techniques
against soft-errors are reviewed and discussed. The author shows
how to model sophisticated radiation effects in condensed matter in
order to quantify and control them, and explains how electronic
systems including servers and routers are shut down due to
environmental radiation.

* Provides an understanding of how electronic systems are shut
down due to environmental radiation by constructing physical models
and numerical algorithms

* Covers both terrestrial and avionic-level conditions

* Logically presented with each chapter explaining the background
physics to the topic followed by various modelling techniques, and
chapter summary

* Written by a widely-recognized authority in soft-errors in
electronic devices

* Code samples available for download from the Companion
Website

This book is targeted at researchers and graduate students in
nuclear and space radiation, semiconductor physics and electron
devices, as well as other areas of applied physics modelling.
Researchers and students interested in how a variety of physical
phenomena can be modelled and numerically treated will also find
this book to present helpful methods.

Autor

Eishi, H. Ibe, Chief Researcher, Yokohama Research Laboratory, Hitachi, Ltd. Dr.Eishi Hidefumi IBE received his Ph.D degree in Nuclear Engineering from Osaka University, Japan in 1985. His expertise covers a wide area of science, such as elementary particle/cosmic ray physics, nuclear /neutron physics, semiconductor physics, mathematics and computing technologies, ion-implantation/mixing and accelerator technologies, electro-chemistry, data-base handling, and BS/Auger/SEM/ Laser-beam micro analysis. He has authored more than 90 international technical papers and presentations including 22 invited contributions in the field of radiation effects. Dr.Ibe was elevated to IEEE Fellow for contributions to analysis of soft-errors in memory devices in 2008.

Produkt-Details

• Erscheint lt. Verlag: 20.1.2016
• Reihe/Serie: Wiley - IEEE
• Reihe/Serie: Wiley - IEEE
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Schlagworte: Circuit Theory & Design / VLSI / ULSI • Electrical & Electronics Engineering • Elektrotechnik u. Elektronik • Halbleiterphysik • Numerical Methods & Algorithms • Numerische Methoden u. Algorithmen • Physics • Physik • Schaltkreise - Theorie u. Entwurf / VLSI / ULSI • Semiconductor physics • ULSI
• ISBN-10: 1-118-47932-7 / 1118479327
• ISBN-13: 978-1-118-47932-2 / 9781118479322