Total-Reflection X-Ray Fluorescence Analysis and Related Methods (eBook)

Reinhold Klockenkämper, Alex von Bohlen (Autoren)

eBook Download: EPUB

2014 | 2. Auflage
John Wiley & Sons (Verlag)
978-1-118-98896-1 (ISBN)

Infos

Providing an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition of Total-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to emphasize new methods and techniques. Written to enable students and scientists to evaluate the suitability of a TXRF method for their specific needs, the text provides an overview to the physical fundamentals and principles of Total-Reflection X-ray Fluorescence (TXRF) Analysis, explains instrumentation and setups, and describes applications in a great variety of disciplines.

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Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation Includes some 700 references for further study

Autor

Reinhold Klockenkämper is physicist and was head of the Physical Analysis Research Group at ISAS in Dortmund, Germany. Furthermore, he was Associate Lecturer at the University of Applied Sciences in Dortmund. His experience in X-ray spectral analysis spans four decades and he published over 100 scientific papers and several book articles. He was member of three Editorial Advisory Boards of international journals for many years. In 1988 and 1996 he organized the 2nd and the 6th conference on TXRF in Dortmund. In 1996 he published the first edition of this monograph on TXRF. Professor Klockenkämper retired in 2002, but is currently working as guest scientist at ISAS. Alex von Bohlen is engineer and senior scientist at the Leibniz-Institut für Analytische Wissenschaften -ISAS- e.V. in Dortmund. He is head of the X-ray laboratories and of the scanning electron and optical microscopy facilities. In addition, he is responsible for the beamline 2 at DELTA, Center for Synchrotron Radiation at the Technical University of Dortmund. Dr. von Bohlen has been working in the field of TXRF since more than 25 years, has published more than 120 articles, mostly dedicated to TXRF, and is member of two Editorial Advisary Boards. In 2011 he organized the 14th conference on TXRF in Dortmund.

Rezensionen

"The inclusion of critical evaluations and recommendations for the applicability of the TXRF and GI-XRF methods makes this book a valuable asset for anyone employing or improving upon these techniques." (Anal Bioanal Chem, 1 April 2015)

Textauszug

List of Acronyms

AC	Alternating current

ADC	Analog-to-digital converter

AFM	Atomic force microscopy

AITR	Attenuated internal total reflection

ALS	Amyotrophic Lateral Sclerosis

AMC	Adiabatic microcalorimeter

ANNA	Activity of Excellence and Networking for Nano- and Microelectronics Analysis

APS	Advanced photon source or American Physical Society

ASTM	American society for testing and materials

ATI	Atom institute

AXIL	Analytical X-ray analysis by iterative least squares

BB	Black body

BCR	Breakpoint cluster region (protein or gene) or British Chemical Standard - Certified reference material

BESSY

Berliner Elektronen Speicherring Gesellschaft für Synchrotronstrahlung

BRM	Blank reference material

CAS	Chemical Abstracts Services

CCD	Charge-coupled device

CHA	Concentric hemispherical analyzer

CHESS

Cornell high-energy synchrotron source

CMA	Cylindrical mirror analyzer

CMOS	Complementary metal oxides

CMOS	Complementary metal oxides semiconductor

CRM	Certified reference material

CVD	Chemical vapor deposition

CXRO	Center for X-ray Optics and Advanced Light Source

DC	Direct current

DCM	Double-crystal monochromator

DESY	Deutsches Elektronen Synchrotron

DIN	Deutsches Institut für Normung

DMM	Double multilayer monochromator

DORIS

Doppel Ring Speicher

EDS	Energy-dispersive spectrometry or spectrometer

EDTA	Ethylene-diaminetetraceticacid

EPMA	Electron probe microanalysis

ESCA	Electron spectroscopy for chemical analysis

ET-AAS

Electrothermal atomic absorption spectrometry

EXAFS

Extended X-ray absorption fine structure

FAAS	Flame atomic absorption spectrometry

FCM	Four-crystal monochromator

FEL	Free-electron laser

FET	Field effect transistor

FPS	Flat panel sensor

FT-IR

Fourier transform-infra red

FWHM	Full width at half maximum

GC-MS

Gas chromatography-mass spectrometry

GeLi	Ge(Li) detector; Germanium drifted with Lithium ions

GE-XRF

Grazing exit X-ray fluorescence

GF-AAS

Graphite furnace-atomic absorption spectrometry

GI-XRD

Grazing incidence X-ray diffractometry

GI-XRF

Grazing incidence X-ray fluorescence

GIE-XRF

Grazing incidence/exit X-ray fluorescence

GLP	Good laboratory practice

HASYLAB

Hamburger Synchrotron Strahlungslabor

HOPG	Highly ordered (oriented) pyrolytic graphite

HPGe	HPGe detector; high-purity Germanium

HPLC	High-performance liquid chromatography

HS	Humic substances

IAEA	International Atomic Energy Agency

IC	Integrated circuit

ICDD	International Centre for Diffraction Data

ICP	Inductively coupled plasma

ICP-MS

Inductively coupled plasma-mass spectrometry

ICP-OES

Inductively coupled plasma-optical emission spectrometry

IDMS	Isotope dilution-mass spectrometry

IEEE	Institute of Electrical and Electronics Engineers

IFG	Institut für Geräteentwicklung

IMEC	Interuniversity Microelectronics Center

INAA	Instrumental neutron activation analysis

IR

Infrared

IRMM	Institute of Reference Materials and Measurements

ISO	International Standard Organization

ITRS	International Technology Roadmap for Semiconductors

IUPAC

International Union for Applied Chemistry

JCPDS

Joint Committee on Powder Diffraction Standards

JFET	Junction Gate FET

KFA	Kernforschungsanlage

LED	Light emitting diode

LINAC

Linear accelerator

MBI	Max-Born Institut

MCA	Multichannel analyzer

MRI	Magnetic resonance imaging

MRT	Magnetic resonance tomography

NEXAFS

Near extended X-ray absorption fine structure

NIES	National Institute for Environmental Studies

NIST	National Institute of Standards and Technology

NSF	Nephrogenic Systemic Fibrosis

NSLS	National Synchrotron Light Source

PES	Photoelectron spectrometry

PGM	Plane grating monochromator

PIN	Positive-intrinsic-negative

PIXE	Proton or particle induced X-ray emission

PMM	Primary methods of measurement

PTB	Physikalisch-Technische Bundesanstalt

PVD	Physical vapor deposition

QM	Quality management

QXAS	Quantitative X-ray analysis system

RBS	Rutherford backscattering spectrometry

RMS	Root mean square (of the mean squared deviations)

ROI	Region of interest

RSD	Relative standard deviation

SAXS	Small angle X-ray scattering

SD	Standard deviation, absolute value

SDD	Silicon drift detector

SDi	Strategic Directions International

SEM	Scanning electron microscopy

SGM	Spherical grating monochromator

SiLi	Si(Li) detector; Silicium drifted with Lithium ions

SIMS	Secondary ion mass spectrometry

SOP	Standard operating procedure

SPM	Suspended particulate matter

SQUID

Superconducting quantum interference device

SR	Synchrotron radiation

SRM	Standard reference material

SSD	Solid-state detector

SSRL	Stanford Synchrotron Radiation Laboratory

STJ	Superconducting tunnel junction

STM	Scanning tunneling microscope or microscopy

SW	Standing wave

TDS	Total dissolved...

Produkt-Details

• Erscheint lt. Verlag: 15.12.2014
• Reihe/Serie: Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications
• Reihe/Serie: Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications
• Reihe/Serie: Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Chemie ► Analytische Chemie
• Themenwelt: Technik
• Schlagworte: Chemie • Chemistry • EXAFS • Fluoreszenzanalyse • materials characterization • Materials Science • Materialwissenschaften • Physical Chemistry • Physikalische Chemie • Röntgenspektroskopie • Reinhold Klockenkamper • Röntgenspektroskopie • Silicon-drift detector with Peltier-cooling • simple wavelength-dispersive X-ray spectrometer • spectroscopy • Spektroskopie • Total-Reflection X-Ray Fluorescence Analysis • TXRF • Werkstoffprüfung • Werkstoffprüfung • XANES
• ISBN-10: 1-118-98896-5 / 1118988965
• ISBN-13: 978-1-118-98896-1 / 9781118988961