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Atomic Force Microscopy-Based Electrical Characterization of Materials

Alba Avila (Autor)

Buch | Hardcover

288 Seiten

2021
Crc Press Inc (Verlag)
978-1-4398-8299-3 (ISBN)

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This timely book introduces the fundamental measurement concepts of the rapidly evolving atomic force microscopy (AFM) techniques for electrical characterization (EFM). It describes experimental approaches and setups, as well as challenges to overcome, and it also provides a wide range of real-world examples illustrating the method. This comprehensive guide for EFM techniques and their applications is an excellent reference for those working on microscopy in different fields, making the methods more accessible to a wider audience and enabling readers to explore the numerous possibilities of electrical techniques as research tools.

Alba Avila, Associate Professor, University of Los Andes, Bogota, Colombia

EFM techniques classification
Detection at Cantilever
Detection across the sample
Capacitance Detection
Current Detection

Conventional and Novel Applications

Perspectives and Challenges
Limits on the scan and detection-speed of EFM techniques
Advances in Standardization of EFM techniques

References

Erscheint lt. Verlag	1.1.2021
Zusatzinfo	110 Illustrations, black and white
Verlagsort	Bosa Roca
Sprache	englisch
Maße	156 x 235 mm
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
Themenwelt	Technik ► Maschinenbau
ISBN-10	1-4398-8299-1 / 1439882991
ISBN-13	978-1-4398-8299-3 / 9781439882993
Zustand	Neuware