2001 IEEE International Reliability Physics Symposium

IEEE Electron Devices Society, IEEE Reliability Society, IEEE, Ch& & & & & (Autoren)

CD-ROM (Software)

2001
I.E.E.E.Press (Hersteller)
978-0-7803-6589-6 (ISBN)

Infos

Based on the 2001 IEEE International Reliability Physics Symposium, this electronic reference covers such topics as: device and process; device dielectrics; assembly and packaging; channel hot carriers; interconnects; ESD and latch-up; process induced damage; and failure analysis.

Produkt-Details

• Erscheint lt. Verlag: 31.5.2001
• Verlagsort: Piscataway NJ
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• ISBN-10: 0-7803-6589-5 / 0780365895
• ISBN-13: 978-0-7803-6589-6 / 9780780365896
• Zustand: Neuware