Scale Issues in Remote Sensing
Seiten
2014
John Wiley & Sons Inc (Hersteller)
978-1-118-80162-8 (ISBN)
John Wiley & Sons Inc (Hersteller)
978-1-118-80162-8 (ISBN)
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This book provides up-to-date developments, methods, and techniques in the field of GIS and remote sensing and features articles from internationally renowned authorities on three interrelated perspectives of scaling issues: scale in land surface properties, land surface patterns, and land surface processes. The book is ideal as a professional reference for practicing geographic information scientists and remote sensing engineers as well as a supplemental reading for graduate level students.
QIHAO WENG, PHD, is a Professor and Director from Indiana State University; an Associate Editor of ISPRS Journal of Photogrammetry and Remote Sensing; the series editor for both Taylor & Francis Series in Remote Sensing Applications and McGraw-Hill Series in GIS and has published more than 150 refereed journal articles and book chapters. He is the Coordinator for GEO Global Urban Observation & Information Task (2012-2015) and was a National Director of American Society for Photogrammetry and Remote Sensing. Dr. Weng was awarded a senior fellowship from NASA in 2008 and an Outstanding Contributions Award in Remote Sensing from American Association of Geographers in 2011.
| Erscheint lt. Verlag | 7.2.2014 |
|---|---|
| Verlagsort | New York |
| Sprache | englisch |
| Maße | 150 x 250 mm |
| Gewicht | 666 g |
| Themenwelt | Naturwissenschaften ► Geowissenschaften ► Geografie / Kartografie |
| Technik ► Elektrotechnik / Energietechnik | |
| ISBN-10 | 1-118-80162-8 / 1118801628 |
| ISBN-13 | 978-1-118-80162-8 / 9781118801628 |
| Zustand | Neuware |
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