Particle Induced Electron Emission II

Buch | Softcover

IX, 223 Seiten

2013
Springer Berlin (Verlag)
978-3-662-14981-2 (ISBN)

Artikel merken

Electron emission is a fundamental phenomenon which accompanies most interactions of energetic particles with solid surfaces. Not only is it a special effect which for almost ninety years has attracted the interest of physicists, but it is also of acute importance in such fields as radiation effects and transport phenomena in solids (e.g., radiation biology), plasma-surface interactions, microtechnology, surface analysis, ion microscopies, particle detector development and others. While Volume I emphasizes the theoretical description of the mechanisms of electron emission, this volume reviews modern experimental trends and aspects of the phenomenon, e.g., kinetic electron emission from massive solids and from thin foils under bombardment with positive, negative, and neutral particles, and the measurement of electron statistics in connection with potential and kinetic emission due to slow singly and multiply charged projectiles.

Kinetic electron emission from solid surfaces under ion bombardment.- Kinetic electron emission from ion penetration of thin foils in relation to the pre-equilibrium of charge distributions.- Slow particle-induced electron emission from solid surfaces.

Erscheint lt. Verlag	3.10.2013
Reihe/Serie	Springer Tracts in Modern Physics
Co-Autor	D. Hasselkamp, H. Rothard, K.-O. Groeneveld, J. Kemmler, P. Varga, H. Winter
Zusatzinfo	IX, 223 p. 15 illus. in color.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	367 g
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
	Technik ► Maschinenbau
Schlagworte	electron • electron spectroscopy • Electron yield • Elektronenausbeute • Elektronenemission • Elektronenspektroskopie • Microscopy • Mikroskopie • protoneninduzierte Elektronenemission • Proton-induced electron emission • scanning microscopy • Scanningmikroskopie • Secondary electron emission • Sekundärelektronenemission • spectroscopy • Surface • surface analysis • Transport
ISBN-10	3-662-14981-8 / 3662149818
ISBN-13	978-3-662-14981-2 / 9783662149812
Zustand	Neuware