Handbook of Nanoscopy (eBook)

Gustaaf van Tendeloo, Dirk van Dyck, Stephen J. Pennycook (Herausgeber)

eBook Download: EPUB

2012 | 1. vollständig überarbeitete Auflage
XXXII, 1418 Seiten
Wiley-VCH (Verlag)
978-3-527-64187-1 (ISBN)

Infos

This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical
to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going
on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,
alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between
methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and
engineers, as well as graduate students and their lecturers.

Autor

Gustaaf Van Tendeloo studied physics and graduated from the University of Antwerp in 1974. He is now a professor at the University of Antwerp (UA) and part time professor at the University of Brussels (VUB). His research focuses on the applications of electron microscopy to different aspects of materials science. He is the author of 700 publications with over 16 000 citations to his work. Professor Van Tendeloo is the head of the electron microscopy group EMAT and director of the "Nano Center of Excellence" of the University. In 2009, he received an ERC Advanced Grant. Dirk Van Dyck is professor in physics and honorary vice-rector for research at the University of Antwerp. He graduated from the University of Antwerp in 1976 and spent his career at this University. Professor Van Dyck and has authored over 300 scientific publications in international journals and was invited speaker at numerous conferences on electron microscopy and image processing. He was one of the co-editors of the Handbook of Microscopy. He received the Honory Franqui Chair of the University of Leuven and holds a Honorary Doctorship of the University of Lima. Stephen J. Pennycook is a Corporate Fellow in the Materials Science and Technology Division at Oak Ridge National Laboratory and leader of the Scanning Transmission Electron Microscopy Group. He graduated from the University of Cambridge in 1975, moving to Oak Ridge National Laboratory in 1982. Professor Pennycook has authored over 380 scientific publications in international journals and was invited speaker at over 200 conferences. He is a member of the editorial boards of four journals and a fellow of five professional societies. For his work on Z-contrast microscopy he was awarded the Materials Research Society Medal and the Thomas Young Medal of the Institute of Physics.

Inhalt

General Introduction
From the Past to the Future

VOLUME I: Methods

LIGHT MICROSCOPY
Fundamentals of Light Microscopy
Optical Contrasting of Microstructures
Near-Field Optical Microscopy
X-RAY MICROSCOPY
Soft X-Ray Imaging
X-Ray Microtomography and X-Ray Topography
MAGNETIC MICROSCOPY
NMR Imaging
FIELD ION MICROSCOPY
Field Emission and Field Ion Microscopy
SCANNING POINT PROBE TECHNIQUES
Scanning Probe Microscopy
Atomic Force Microscopy
ELECTRON MICROSCOPY: STATIONARY BEAM METHODS
Transmission Electron Microscopy (TEM)
High-Resolution TEM
Aberration-Corrected High Resolution Microscopy
Electron Energy Loss Spectroscopy Imaging
Low Energy Electron Microscopy
Lorentz Microscopy
Electron Holography Methods
Electron Tomography
In-Situ TEM
Nanolab
Dynamic TEM
SCANNING BEAM METHODS
Scanning Electron Microscopy and Scanning Ion Microscopy
Focused Ion Beam Microscopy
Scanning Transmission Electron Microscopy: Z Contrast
Composition Mapping
Imaging Secondary Ion Mass Spectroscopy
IMAGE RECORDING, HANDLING AND PROCESSING
Image Recording in Microscopy
Image Processing
Statistical Parameter Estimation

VOLUME 2: Applications

Metals and Alloys
Minerals and Geological Materials
Ferroic Materials
Grain Boundaries and Structural Ceramics
Non-Periodic Structures and Amorphous Materials
Quasi-Crystalline Materials
Carbon
Polymers and Monomeric Analogs
Magnetic Materials
Small Particles
Preparation Techniques for Transmission Electron Microscopy
Catalytic Materials and Porous Materials
Nanowires and Nanotubes
Biomaterials
Complex Oxides
Energy Materials
Surfaces and Interfaces
Polymers
Semiconductors and Semiconducting Devices
Optoelectronic and Spintronics Materials
VOLUME 1

PREFACE

THE PAST, THE PRESENT, AND THE FUTURE OF NANOSCOPY

PART I: Methods

TRANSMISSION ELECTRON MICROSCOPY
Introduction
The Instrument
Imaging and Diffraction Modes
Dynamical Diffraction Theory

ATOMIC RESOLUTION ELECTRON MICROSCOPY
Introduction
Principles of Linear Image Formation
Imaging in the Electron Microscope
Experimental HREM
Quantitative HREM

ULTRAHIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY AT NEGATIVE SPHERICAL ABERRATION
Introduction
The Principles of Atomic-Resolution Imaging
Inversion of the Imaging Process
Case Study: SrTiO3
Practical Examples of Application of NCSI Imaging

Z-CONTRAST IMAGING
Recent Progress
Introduction to the Instrument
Imaging in the STEM
Future Outlook

ELECTRON HOLOGRAPHY
Image-Plane Off-Axis Holography Using the Electron Biprism
Properties of the Reconstructed Wave
Holographic Investigations
Special Techniques
Summary

LORENTZ MICROSCOPY AND ELECTRON HOLOGRAPHY OF MAGNETIC MATERIALS
Introduction
Lorentz Microscopy
Off-Axis Electron Holography
Discussion and Conclusions

ELECTRON TOMOGRAPHY
History and Background
Theory of Tomography
Electron Tomography, Missing Wedge, and Imaging Modes
STEM Tomography and Applications
Hollow-Cone DF Tomography
Diffraction Contrast Tomography
Electron Holographic Tomography
Inelastic Electron Tomography
Advanced Reconstruction Techniques
Quantification and Atomic Resolution Tomography

STATISTICAL PARAMETER ESTIMATION THEORY - A TOOL FOR QUANTITATIVE ELECTRON MICROSCOPY
Introduction
Methodology
Electron Microscopy Applications
Conclusions

DYNAMIC TRANSMISSION ELECTRON MICROSCOPY
Introduction
Time-Resolved Studies Using Electrons
Building a DTEM
Applications of DTEM
Future Developments for DTEM
Conclusions

TRANSMISSION ELECTRON MICROSCOPY AS NANOLAB
TEM and Measuring the Electrical Properties
TEM with MEMS-Based Heaters
TEM with Gas Nanoreactors
TEM with Liquid Nanoreactors
TEM and Measuring Optical Properties
Sample Preparation for Nanolab Experiments

ATOMIC-RESOLUTION ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPY
Introduction
Atomic-Resolution ETEM
Development of Atomic-Resolution ETEM
Experimental Procedures
Applications with Examples
Nanoparticles and Catalytic Materials
Oxides
In situ Atomic Scale Twinning Transformations in Metal Carbides
Dynamic Electron Energy Loss Spectroscopy
Technological Benefits of Atomic-Resolution ETEM
Other Advances
Reactions in the Liquid Phase
In situ Studies with Aberration Correction
Examples and Discussion
Applications to Biofuels
Conclusions

SPECKLES IN IMAGES AND DIFFRACTION PATTERNS
Introduction
What Is Speckle?
What Causes Speckle?
Diffuse Scattering
From Bragg Reflections to Speckle
Coherence
Fluctuation Electron Microscopy
Variance versus Mean
Speckle Statistics
Possible Future Directions for Electron Speckle Analysis

COHERENT ELECTRON DIFFRACTIVE IMAGING
Introduction
Coherent Nanoarea Electron Diffraction
The Noncrystallographic Phase Problem
Coherent Diffractive Imaging of Finite Objects
Phasing Experimental Diffraction Pattern
Conclusions

SAMPLE PREPARATION TECHNIQUES FOR TRANSMISSION ELECTRON MICROSCOPY
Introduction
Indirect Preparation Methods
Direct Preparation Methods
Summary

SCANNING PROBE MICROSCOPY - HISTORY, BACKGROUND, AND STATE OF THE ART
Introduction
Detecting Evanescent Waves by Near-Field Microscopy: Scanning Tunneling Microscopy
Interaction of Tip - Sample Electrons Detected by Scanning Near-Field Optical Microscopy and Atomic Force Microscopy
Methods for the Detection of Electric/Electronic Sample Properties
Methods for the Detection of Electromechanical and Thermoelastic Quantities
Advanced SFM/SEM Microscopy

SCANNING PROBE MICROSCOPY - FORCES AND CURRENTS IN THE NANOSCALE WORLD
Introduction
Scanning Probe Microscopy-the Science of Localized Probes
Scanning Tunneling Microscopy and Related Techniques
Force-Based SPM Measurements
Voltage Modulation SPMs
Current Measurements in SPM
Emergent SPM Methods
Manipulation of Matter by SPM
Perspectives

SCANNING BEAM METHODS
S

Produkt-Details

• Erscheint lt. Verlag: 21.12.2012
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Schlagworte: Bildgebendes Verfahren • Bildgebende Systeme u. Verfahren • Biowissenschaften • Chemie • Chemistry • Electrical & Electronics Engineering • Elektrotechnik u. Elektronik • Festkörperphysik • Festkörperphysik • Imaging Systems & Technology • Life Sciences • materials characterization • Materials Science • Materialwissenschaften • Mikroskopie • Nanomaterialien • nanomaterials • Nanophysics • Nanophysik • Nanotechnologie • nanotechnology • Physical Chemistry • Physics • Physik • Physikalische Chemie • Solid state physics • Werkstoffprüfung • Werkstoffprüfung
• ISBN-10: 3-527-64187-4 / 3527641874
• ISBN-13: 978-3-527-64187-1 / 9783527641871