Introduction to Advanced System-on-Chip Test Design and Optimization (eBook)
XX, 388 Seiten
Springer US (Verlag)
978-0-387-25624-5 (ISBN)
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies
Testing Concepts.- Design Flow.- Design for Test.- Boundary Scan.- SOC Design for Testability.- System Modeling.- Test Conflicts.- Test Power Dissipation.- Test Access Mechanism.- Test Scheduling.- SOC Test Applications.- A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling.- An Integrated Framework for the Design and Optimization of SOC Test Solutions.- Efficient Test Solutions for Core-Based Designs.- Core Selection in the SOC Test Design-Flow.- Defect-Aware Test Scheduling.- An Integrated Technique for Test Vector Selection and Test Scheduling under ATE Memory Depth Constraint.
| Erscheint lt. Verlag | 30.3.2006 |
|---|---|
| Reihe/Serie | Frontiers in Electronic Testing | Frontiers in Electronic Testing |
| Zusatzinfo | XX, 388 p. |
| Verlagsort | New York |
| Sprache | englisch |
| Themenwelt | Technik ► Elektrotechnik / Energietechnik |
| Technik ► Maschinenbau | |
| Schlagworte | Automation • Boundary Scan • consumption • Integrated circuit • SOC test design • System-on-Chip • Transistor |
| ISBN-10 | 0-387-25624-5 / 0387256245 |
| ISBN-13 | 978-0-387-25624-5 / 9780387256245 |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
| Haben Sie eine Frage zum Produkt? |
PDF (Wasserzeichen)DRM: Digitales Wasserzeichen
Dieses eBook enthält ein digitales Wasserzeichen und ist damit für Sie personalisiert. Bei einer missbräuchlichen Weitergabe des eBooks an Dritte ist eine Rückverfolgung an die Quelle möglich.
Dateiformat: PDF (Portable Document Format)
Mit einem festen Seitenlayout eignet sich die PDF besonders für Fachbücher mit Spalten, Tabellen und Abbildungen. Eine PDF kann auf fast allen Geräten angezeigt werden, ist aber für kleine Displays (Smartphone, eReader) nur eingeschränkt geeignet.
Systemvoraussetzungen:
PC/Mac: Mit einem PC oder Mac können Sie dieses eBook lesen. Sie benötigen dafür einen PDF-Viewer - z.B. den Adobe Reader oder Adobe Digital Editions.
eReader: Dieses eBook kann mit (fast) allen eBook-Readern gelesen werden. Mit dem amazon-Kindle ist es aber nicht kompatibel.
Smartphone/Tablet: Egal ob Apple oder Android, dieses eBook können Sie lesen. Sie benötigen dafür einen PDF-Viewer - z.B. die kostenlose Adobe Digital Editions-App.
Buying eBooks from abroad
For tax law reasons we can sell eBooks just within Germany and Switzerland. Regrettably we cannot fulfill eBook-orders from other countries.
aus dem Bereich
