Microelectronics Failure Analysis Desk Reference

Electronic Device Failure Analysis Society (Autor)

Media-Kombination

800 Seiten

2012 | Sixth Edition
ASM International
978-1-61503-725-4 (ISBN)

Titel ist leider vergriffen;
keine Neuauflage

Artikel merken

This updated reference book, prepared by experts in their fields, contains dozens of articles covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips.

Topic coverage includes:
• Failure Analysis Process Flow
• Failure Verification
• Failure Modes and Failure Classification
• Special Devices (MEMS, Optoelectronics, Passives)
• Fault Localisation Techniques: Package Level (NDT)
• Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods)
• Deprocessing & Imaging Techniques: Deprocessing
• General Imaging Techniques
• Local Deprocessing & Imaging
• Circuit Edit and Design Modification
• Material Analysis Techniques
• Reference Information: Important Topics for Semiconductor Devices
• Failure Analysis Techniques Roadmap
• Failure Analysis Operations and Management
• Appendices: Failure Analysis Terms, Definitions, and Acronyms
• Industry Standards

Erscheint lt. Verlag	30.1.2012
Verlagsort	Ohio
Sprache	englisch
Themenwelt	Technik ► Elektrotechnik / Energietechnik
Themenwelt	Technik ► Maschinenbau
ISBN-10	1-61503-725-X / 161503725X
ISBN-13	978-1-61503-725-4 / 9781615037254
Zustand	Neuware