Digital Noise Monitoring of Defect Origin

Telman Aliev (Autor)

Buch | Softcover

224 Seiten

2010 | Softcover reprint of hardcover 1st ed. 2007
Springer-Verlag New York Inc.
978-1-4419-4410-8 (ISBN)

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Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.

Erscheint lt. Verlag	24.11.2010
Reihe/Serie	Lecture Notes in Electrical Engineering ; 2
Zusatzinfo	XII, 224 p.
Verlagsort	New York, NY
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Mathematik / Informatik ► Informatik
	Mathematik / Informatik ► Mathematik ► Angewandte Mathematik
	Technik ► Elektrotechnik / Energietechnik
	Technik ► Nachrichtentechnik
ISBN-10	1-4419-4410-9 / 1441944109
ISBN-13	978-1-4419-4410-8 / 9781441944108
Zustand	Neuware