Spectrum and Network Measurements
SciTech Publishing Inc (Verlag)
978-1-61353-014-6 (ISBN)
Spectrum and Network Measurements, 2nd Edition has been completely updated to take into account the latest technology, particularly focusing on the shift from analog to digital in communication systems, plus an important new chapter on EMC measurements of radiated and conducted emissions has also been added. Using simplified block diagrams, this book offers a thorough coverage of critical concepts, such as decibels, Fourier analysis, noise effects, impedance matching, intermodulation distortion, reflection measurements, and S-Parameters.
By picking up where the majority of electrical engineering programs stop, this title takes basic EE theory and translates it to the world of electronic measurements. This enables the reader to understand the basic theory of signals and systems, relate it to measured results, and apply it when creating new designs.
Robert A. Witte received a BSEE degree from Purdue University and MSEE degree from Colorado State University. He has spent his entire career in the test and measurement industry, working for Hewlett-Packard, Agilent Technologies, and Keysight Technologies. Robert has contributed to the development of spectrum analyzers, network analyzers, oscilloscopes and other instruments. He has held a number of R&D management positions and is currently the Vice President of Technology Leadership for Keysight Technologies. Robert is also the author of Electronic Test Instruments: Analog and Digital Measurements.
Chapter 1: Introduction to Spectrum and Network Measurements
Chapter 2: Decibels
Chapter 3: Fourier Theory
Chapter 4: Fast Fourier Transform Analyzers
Chapter 5: Swept Spectrum Analyzers
Chapter 6: Modulation Measurements
Chapter 7: Distortion Measurements
Chapter 8: Noise and Noise Measurements
Chapter 9: Pulse Measurements
Chapter 10: Averaging and Filtering
Chapter 11: Transmission Lines
Chapter 12: Measurement Connections
Chapter 13: Two-Port Networks
Chapter 14: Network Analyzers
Chapter 15: Vector Network Measurements
Chapter 16: EMC Measurements
Chapter 17: Analyzer Performance and Specifications
Appendix A: Two-Port Vector Error Correction
Erscheint lt. Verlag | 1.12.2014 |
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Reihe/Serie | Electromagnetic Waves |
Verlagsort | New York |
Sprache | englisch |
Maße | 178 x 254 mm |
Themenwelt | Mathematik / Informatik ► Informatik ► Netzwerke |
Sozialwissenschaften | |
Technik ► Elektrotechnik / Energietechnik | |
ISBN-10 | 1-61353-014-5 / 1613530145 |
ISBN-13 | 978-1-61353-014-6 / 9781613530146 |
Zustand | Neuware |
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