Advances in Imaging and Electron Physics (eBook)

Peter W. Hawkes (Autor)

eBook Download: PDF | EPUB

2011 | 1. Auflage
344 Seiten
Elsevier Science (Verlag)
978-0-08-046536-4 (ISBN)

Infos

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Inhalt

Front cover 1
Title page 4
Copyright page 5
Contents 6
Contributors 10
Preface 12
Future Contributions 14
Recent Progress in High Frequency Electron Cyclotron Resonance Ion Sources 18
Introduction 19
I. Fundamental Aspects of ECRIS 21
II. Wave Coupling in an ECRIS 32
III. VUV Diagnostics of ECRIS Plasmas 48
IV. Magnetic Confinement 64
V. Design of Various Electron Cyclotron Resonance Ion Sources 92
VI. Industrial Applications 152
VII. Conclusion 165
References 167
Fixed Points of Lattice Transforms and Lattice Associative Memories 182
I. Introduction 182
II. Pertinent Basic Properties of Lattices 184
III. Matrices and Lattice-Ordered Groups 187
IV. Lattice Dependence and Independence 188
V. Lattice Associative Memories 192
VI. Lattice Dependence and Fixed Points 198
VII. Convex Sets and Polytopes in Rn 202
VIII. Linear Subspaces and Orientation in Rn 204
IX. The Shape of F(X) 210
X. Remarks Concerning the Dimensionality of F(X) 215
XI. Strong Lattice Independence 220
XII. Pattern Reconstruction from Noisy Inputs 230
XIII. Kernel Vectors 238
XIV. Associative Memories Based on Dendritic Computing 245
XV. Conclusion 255
References 255
An Extension of Mathematical Morphology to Complex Signals 260
I. Introduction 260
II. Order Relationship and Complementation 264
III. Dilations and Erosions 272
IV. Openings, Closings, and Morphological Filters 275
V. Geodesy 278
VI. Top Hats 289
VII. Morphological Gradients 289
VIII. Complex Watershed 292
IX. Measurements 295
X. Conclusion 303
References 305
Ranking Metrics and Evaluation Measures 308
I. Introduction 308
II. Distance Metric Analysis 312
III. Boosting Distance Metrics for Similarity Estimation 317
IV. Experiments and Analysis 320
V. Discussion and Conclusions 329
References 331
Index 334

Produkt-Details

• Erscheint lt. Verlag: 29.7.2011
• Sprache: englisch
• Themenwelt: Sachbuch/Ratgeber
• Themenwelt: Mathematik / Informatik ► Informatik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
• Themenwelt: Technik ► Bauwesen
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-08-046536-6 / 0080465366
• ISBN-13: 978-0-08-046536-4 / 9780080465364