Acoustic Microscopy
Second Edition
Seiten
2009
|
2nd Revised edition
Oxford University Press (Verlag)
978-0-19-923273-4 (ISBN)
Oxford University Press (Verlag)
978-0-19-923273-4 (ISBN)
For many years Acoustic Microscopy has been the definitive book on the subject. A key development since it was first published has been the development of ultrasonic force microscopy. The 2nd edition has a major new chapter on this technique and its applications.
Acoustic microscopy enables the elastic properties of materials to be imaged and measured with the resolution of a good microscope. By using frequencies in the microwave regime, it is possible to make the acoustic wavelength comparable with the wavelength of light, and hence to achieve a resolution comparable with an optical microscope. Solids can support both longitudinal and transverse acoustic waves. At surfaces a unique combination of the two known as Raleigh waves can propagate, and in many circumstances these dominate the contrast in acoustic microscopy. Following the invention of scanning probe microscopes, it is now possible to use an atomic force microscope to detect the acoustic vibration of a surface with resolution in the nanometre range, thus beating the diffraction limit by operating in the extreme near-field. This second edition of Acoustic Microscopy has a major new chapter on the technique and applications of acoustically excited probe microscopy.
Acoustic microscopy enables the elastic properties of materials to be imaged and measured with the resolution of a good microscope. By using frequencies in the microwave regime, it is possible to make the acoustic wavelength comparable with the wavelength of light, and hence to achieve a resolution comparable with an optical microscope. Solids can support both longitudinal and transverse acoustic waves. At surfaces a unique combination of the two known as Raleigh waves can propagate, and in many circumstances these dominate the contrast in acoustic microscopy. Following the invention of scanning probe microscopes, it is now possible to use an atomic force microscope to detect the acoustic vibration of a surface with resolution in the nanometre range, thus beating the diffraction limit by operating in the extreme near-field. This second edition of Acoustic Microscopy has a major new chapter on the technique and applications of acoustically excited probe microscopy.
Professor Andrew Briggs Professor of Nanomaterials Department of Materials University of Oxford Dr Oleg Kolosov Department of Physics University of Lancaster
1. Son et Lumiere ; 2. Focusing and Scanning ; 3. Resolution ; 4. Lens Design and Selection ; 5. Electronic Circuits for Quantitative Microscopy ; 6. A Little Elementary Acoustics ; 7. Contrast Theory ; 8. Experimental Elastic Microanalysis ; 9. Biological Tissue ; 10. Layered Structures ; 11. Anisotropy ; 12. Surface Cracks and Boundaries ; 13. Acoustically Excited Probe Microscopy ; 14. So what happens when you defocus? ; References ; Index
| Erscheint lt. Verlag | 17.9.2009 |
|---|---|
| Reihe/Serie | Monographs on the Physics and Chemistry of Materials ; 67 |
| Zusatzinfo | 111 line drawings, 116 halftones, 12 colour images |
| Verlagsort | Oxford |
| Sprache | englisch |
| Maße | 162 x 241 mm |
| Gewicht | 784 g |
| Themenwelt | Naturwissenschaften ► Chemie |
| Naturwissenschaften ► Physik / Astronomie ► Mechanik | |
| Technik ► Maschinenbau | |
| ISBN-10 | 0-19-923273-3 / 0199232733 |
| ISBN-13 | 978-0-19-923273-4 / 9780199232734 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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