Atomic Force Microscopy: A Concise Introduction

Nancy A Burnham (Autor)

Buch | Hardcover

250 Seiten

2026
World Scientific Publishing Co Pte Ltd (Verlag)
978-981-98-2309-3 (ISBN)

Infos

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) — a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

Produkt-Details

• Erscheint lt. Verlag: 30.1.2026
• Verlagsort: Singapore
• Sprache: englisch
• Themenwelt: Naturwissenschaften
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 981-98-2309-9 / 9819823099
• ISBN-13: 978-981-98-2309-3 / 9789819823093
• Zustand: Neuware