Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials
Seiten
2005
Springer Berlin (Hersteller)
978-3-540-38910-1 (ISBN)
Springer Berlin (Hersteller)
978-3-540-38910-1 (ISBN)
A brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Experimental determination of partial structural functions.- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials.- Theoretical aspects on the anomalous dispersion factors of x-rays.- Experimental determination of the anomalous dispersion factors.- Selected examples of structural determination using anomalous (resonance) x-ray scattering.- Relative merits of anomalous x-ray scattering and its future prospects.
| Erscheint lt. Verlag | 19.11.2005 |
|---|---|
| Reihe/Serie | Lecture Notes in Physics |
| Physics and Astronomy | Physics and Astronomy (R0) |
| Zusatzinfo | VI, 186 p. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Themenwelt | Naturwissenschaften ► Geowissenschaften ► Geologie |
| Technik ► Maschinenbau | |
| Schlagworte | Dispersion • Experiment • Materials • Röntgenbeugung • scattering • Structure • Ungeordnetes System • X-Ray • X-ray crystallography |
| ISBN-10 | 3-540-38910-5 / 3540389105 |
| ISBN-13 | 978-3-540-38910-1 / 9783540389101 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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