Metrology for THz Communications
Springer International Publishing (Verlag)
9783032019851 (ISBN)
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This book provides a state-of-the-art overview of metrology for upcoming THz communications, considered a key component of next generation wireless communication systems. Effective methods to conduct and evaluate measurements are crucial for the advancement of THz communication systems. However, at the start of the project in 2019, metrology at THz frequencies was still in its infancy, and thus far had only addressed detector calibration to characterize ultrafast devices as well as measuring uncertainty analyses of different spectrometer types available at THz frequencies.
This book highlights how the grand challenge of metrology in THz communication measurements was addressed systematically in the publicly funded project DFG FOR 2863 Meteracom (Metrology for Terahertz Communications). It delves into four distinct and foundational project areas: traceability to the International System of Units (SI), characterization of the measurement system itself, metrological characterization of the RF components and the propagation channel, and measurements required for enabling the functionality of THz communications. This is an open access book.Thomas Kürner (Fellow IEEE) received his Dipl.-Ing. degree in Electrical Engineering in 1990, and his Dr.-Ing. degree in 1993, both from University of Karlsruhe (Germany). From 1990 to 1994 he was with the Institut für Höchstfrequenztechnik und Elektronik (IHE) at the University of Karlsruhe working on wave propagation modelling, radio channel characterization and radio network planning. From 1994 to 2003, he was with the radio network planning department at the headquarters of the GSM 1800 and UMTS operator E-Plus Mobilfunk GmbH & Co KG, Düsseldorf, where he was team manager radio network planning support responsible for radio network planning tools, algorithms, processes and parameters from 1999 to 2003. Since 2003 he is Full University Professor for Mobile Radio Systems at the Technische Universität Braunschweig. In 2012 he was a guest lecturer at Dublin City University within the Telecommunications Graduate Initiative in Ireland. Currently he is chairing the IEEE 802.15 Standing Committee THz and the ETSI Industrial Specification Group THz. He was also the chair of IEEE 802.15.3d TG 100G, which developed the worldwide first wireless communications standard operating at 300 GHz. He was the project coordinator of the H2020-EU-Japan project ThoR ( TeraHertz end-to-end wireless systems supporting ultra-high data Rate applications ) and is Coordinator of the German DFG-Research Unit FOR 2863 Meteracom ( Metrology for THz Communications ). In 2019 and 2022 he received the Neal-Shephard Award of the IEEE Vehicular Technology Society (VTS) and also in 2022 the Best Teacher Award of the European School on Antennas and Propagation (ESoA). He is one of the editors of the Springer book on "THz communications". he has also authored or co-authered numerous book chapters.
Tobias Doeker received his Bachelor of Science (B.Sc.) degree in Electrical Engineering from Hamburg University of Applied Science in 2017 and hisMaster of Science (M.Sc.) degree in Electrical Engineering with the focus on communications technology from Technische Universität Braunschweig in 2019. Besides, from 2013 to 2019 he was a student trainee at Lufthansa Technik AG in Hamburg.
Chapter 1. Introduction.- Chapter 2. Metrology Definition, Use Cases, Added Value.- Chapter 3. RF Power Metrology.- Chapter 4. Phase Noise Metrology.- Chapter 5. Waveform Metrology.- Chapter 6. Vector Network Analysis.- Chapter 7. Terahertz Time-Domain Spectroscopy.- Chapter 8. Channel Sounding.- Chapter 9. Photonics Assisted Signal Processing.- Chapter 10. Ray Tracing for Metrology.- Chapter 11. Hardware Acceleration.- Chapter 12. Waveform Traceability Chain to coaxial EOS.- Chapter 13. Characterising VNA Measurements of Time-Varying Sub-Terahertz Transmissions.- Chapter 14. THz Waveform Traceability.- Chapter 15. Constellation Diagrams, EVM, and Error Correction.- Chapter 16. Architecture for Channel Sounding.- Chapter 17. Multidimensional Parameter Estimation for Channel Sounding.- Chapter 18. Variable Reference Structure for THz Channel Sounding.- Chapter 19. Artefacts for Channel Sounding Performance Evaluation.- Chapter 20. Integrated Photonics Assisted Signal Processing and Thermal Crosstalk.- Chapter 21. Error Metrics for Photonics Assisted Signal Processing.- Chapter 22. Photonics Assisted Signal Processing Systems using Parallelisation in Time and Frequency Domain.- Chapter 23. Metrological Analysis of Non-idealities for Photonics Assisted Signal Processing.- Chapter 24. Metrology of mmW- and THz-Frequency- and Time-DomainWaveforms.- Chapter 25. Behavioural Characterization of Nonlinear Distortion.- Chapter 26. Electronic Signal Generation.- Chapter 27. Electronic Signal Conversion, Signal Amplification and Distortion Mechanisms.- Chapter 28. Frequency Synthesis based on MLLs.- Chapter 29. Integrated Photonically Assisted Samplers.- Chapter 30. Atmospheric Aspects.- Chapter 31. Building Materials.- Chapter 32. Interaction of Objects with THz Beams.- Chapter 33. Multipath Propagation in Rich Scattering.- Chapter 34. Time-variant Propagation Channel including Metrics and Multi-link Connection. Chapter 35. Physical Layer Security. Chapter 36. Simulation and Modelling of Electronic and Photonic Components.- Chapter 37. Link- and System-Level Simulation Towards Digital Twinning.- Chapter 38. Trustworthy Modulation Recognition.- Chapter 39. THz Networks with Intelligent Control and Digital Twining.- Chapter 40. Device Discovery.- Chapter 41. Beam Tracking and Switching.
| Erscheinungsdatum | 29.11.2025 |
|---|---|
| Reihe/Serie | Springer Series in Optical Sciences |
| Zusatzinfo | X, 658 p. 280 illus., 252 illus. in color. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Optik |
| Schlagworte | 6G • channel characterisation • Channel Sounding • device discovery • EVM • open access • optical sampling • RF impairments • THz Communications • THz metrology • THz photonics • vector network analysis |
| ISBN-13 | 9783032019851 / 9783032019851 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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