Chemical Analysis and Material Characterization by Spectrophotometry (eBook)
336 Seiten
Elsevier Science (Verlag)
978-0-12-814867-9 (ISBN)
Bhim Prasad Kaflé was born in Nepal in 1975 and received an MSc. in Physical Chemistry from Tribhuvan University, Nepal in 1998. He also received an MSc. degree in Solar Energy and Environmental Physics from Ben-Gurion University of Negev, Israel in 2004 where he investigated the effect of electrical current on the diffusion process of dopant on thin solid films. He was awarded with a PhD from Graduate University for Advanced Studies, Japan in Physics in 2008. He then pursued his research as a postdoctoral fellow on reaction dynamics of metal and carbon cluster at Weizmann Institute of Science, Israel. During this period he was supported with UNESCO/ISRAEL co-sponsored Fellowship (2009 - 2011) in Israel.Dr. Kaflé has been working as assistant professor since November 2011 at the Department of Chemical Science and Chemical Engineering, Kathmandu University, Nepal. He has published about 20 scientific articles in peer reviewed journals in both fundamental physics (particle physics) and material science. His current research interest is the synthesis of nanomaterial-based devices for solar energy harvesting.Dr. Kaflé is a lifelong member of Chemical Society of Nepal and was awarded with The World Academy of Science Award (TWAS) (Conferred in 2012) by TWAS Foundation, Italy.
Chemical Analysis and Material Characterization by Spectrophotometry integrates and presents the latest known information and examples from the most up-to-date literature on the use of this method for chemical analysis or materials characterization. Accessible to various levels of expertise, everyone from students, to practicing analytical and industrial chemists, the book covers both the fundamentals of spectrophotometry and instrumental procedures for quantitative analysis with spectrophotometric techniques. It contains a wealth of examples and focuses on the latest research, such as the investigation of optical properties of nanomaterials and thin solid films. - Covers the basic analytical theory that is essential for understanding spectrophotometry- Emphasizes minor/trace chemical component analysis- Includes the spectrophotometric analysis of nanomaterials and thin solid films- Thoroughly describes methods and uses easy-to-follow, practical examples and experiments
| Erscheint lt. Verlag | 29.11.2019 |
|---|---|
| Sprache | englisch |
| Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
| Technik ► Maschinenbau | |
| ISBN-10 | 0-12-814867-5 / 0128148675 |
| ISBN-13 | 978-0-12-814867-9 / 9780128148679 |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
| Haben Sie eine Frage zum Produkt? |
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