Resolving locations of defects in superconducting transmon qubits
Seiten
2019
KIT Scientific Publishing (Verlag)
9783731509677 (ISBN)
KIT Scientific Publishing (Verlag)
9783731509677 (ISBN)
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
| Erscheint lt. Verlag | 9.12.2019 |
|---|---|
| Reihe/Serie | Experimental Condensed Matter Physics ; 27 |
| Zusatzinfo | graph. Darst. |
| Sprache | englisch |
| Maße | 170 x 240 mm |
| Gewicht | 335 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
| Schlagworte | Defektspektroskopie mitt elektrischer und elastisc • Defektspektroskopie mitt elektrischer und elastischer Felder • material defects and decoherence • Materialdefekte und Dekohärenz • Quanten Bits • Quantenrechner • quantum bit • Quantum Computing • spectroscopy of defects with dc-electric and elast • spectroscopy of defects with dc-electric and elastic fields • Transmon Qubit |
| ISBN-13 | 9783731509677 / 9783731509677 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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