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Introduction to Conventional Transmission Electron Microscopy - Marc De Graef

Introduction to Conventional Transmission Electron Microscopy

(Autor)

Buch | Softcover
742 Seiten
2003
Cambridge University Press (Verlag)
978-0-521-62995-9 (ISBN)
CHF 189,95 inkl. MwSt
This graduate level 2003 textbook covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text.
This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.

Professor of Materials Science and Engineering at Carnegie Mellon University.

1. Basic crystallography; 2. Basic quantum mechanics; 3. The transmission electron microscope; 4. Getting started; 5. Dynamical electron scattering in perfect crystals; 6. Two-beam theory in defect-free crystals; 7. Systematic row and zone axis orientations; 8. Defects in crystals; 9. Electron diffraction patterns; 10. Phase contrast microscopy; Appendices.

Erscheint lt. Verlag 27.3.2003
Zusatzinfo Worked examples or Exercises; 25 Tables, unspecified; 108 Halftones, unspecified; 214 Line drawings, unspecified
Verlagsort Cambridge
Sprache englisch
Maße 170 x 244 mm
Gewicht 1160 g
Themenwelt Naturwissenschaften Chemie Physikalische Chemie
Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik Maschinenbau
ISBN-10 0-521-62995-0 / 0521629950
ISBN-13 978-0-521-62995-9 / 9780521629959
Zustand Neuware
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