Electron and Ion Microscopy and Microanalysis
Principles and Applications, Second Edition,
Seiten
2019
|
2nd edition
CRC Press (Verlag)
9780367402945 (ISBN)
CRC Press (Verlag)
9780367402945 (ISBN)
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Lawrence E. Murr
CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.
| Erscheinungsdatum | 21.11.2019 |
|---|---|
| Verlagsort | London |
| Sprache | englisch |
| Maße | 178 x 254 mm |
| Gewicht | 453 g |
| Themenwelt | Naturwissenschaften ► Biologie |
| Naturwissenschaften ► Physik / Astronomie ► Optik | |
| ISBN-13 | 9780367402945 / 9780367402945 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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