High-Resolution Transmission Electron Microscopy and Associated Techniques
Seiten
1989
Oxford University Press (Verlag)
978-0-19-504275-7 (ISBN)
Oxford University Press (Verlag)
978-0-19-504275-7 (ISBN)
Provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. This book includes discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, and more.
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopies and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, minerology, semiconductors, and metals. Contributors include: J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopies and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, minerology, semiconductors, and metals. Contributors include: J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.
Imaging; Imaging theory; Elastic scattering of electrons by crystals; Elastic scattering theory; Inelastic electron scattering; Inelastic scattering II; Techniques closely related to high resolution electron microscopy; Calculation of diffraction patterns and images for Fasr electrons; Mineralogy; Contributions of high resolution electron microscopy studies to solid state chemistry; Materials science: metals, ceramics, and semiconductors; Practical high resolution electron microscopy; Surfaces; Highly disordered materials
| Erscheint lt. Verlag | 13.7.1989 |
|---|---|
| Zusatzinfo | numerous illustrations, diagrams and tables |
| Verlagsort | Oxford |
| Sprache | englisch |
| Maße | 162 x 245 mm |
| Gewicht | 1499 g |
| Themenwelt | Naturwissenschaften |
| ISBN-10 | 0-19-504275-1 / 0195042751 |
| ISBN-13 | 978-0-19-504275-7 / 9780195042757 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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