Electron Impact Ionization and High-Resolution Electron Attachment

Studies of Relaxation Mechanisms in Argon Dimers Upon Electron Impact and Electron Attachment to Doped Helium Droplets

Elias Jabbour Al Maalouf (Autor)

Buch | Softcover

220 Seiten

2016
Südwestdeutscher Verlag für Hochschulschriften
978-3-8381-5268-4 (ISBN)

Titel nicht im Sortiment

Artikel merken

In this study, investigation of some low electron (100eV)interactions with and within clusters was conducted. For this investigation, two apparatuses were employed. A helium droplet source combined with a hemispherical electron monochromator and a quadrupole mass spectrometer, and a rare gas cluster source combined with an electron impact reaction microscope. Evidence for two relaxation channels in argon dimer was found and clearly separated. High-resolution electron attachment to helium atoms inside helium droplets led to the accurate determination of the positions of three resonance structures and a fourth newly identified structure. The evolution of the conduction band of helium droplets with the evolution of their size was revealed with high accuracy. It was disclosed that the electron attachment water clusters gradually becomes more and more favored at slightly higher projectile electron energies as the cluster gets larger. This observation is traced back to the different structure for clusters consisting of different number of water molecules.

Jabbour Al Maalouf, EliasElias Jabbour Al Maalouf was born in Lebanon. He attended high school there. He attained his B.S. in physics at the Lebanese university, a Masters in physics (Laser Applications in Medicine and Industry)after researching at the Open University, U.K. and PhD in Physics at the University of Innsbruck, Austria. He knows Arabic, English, and German.

Erscheinungsdatum	17.10.2016
Sprache	englisch
Maße	150 x 220 mm
Gewicht	344 g
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
Schlagworte	Argon Dimer • Cold Clusters • Electron Attachment • electron impact ionization • Helium Droplets • ICD • Mass spectroscopy • RCT • water clusters
ISBN-10	3-8381-5268-9 / 3838152689
ISBN-13	978-3-8381-5268-4 / 9783838152684
Zustand	Neuware