Microbeam Analysis
Institute of Physics Publishing (Verlag)
978-0-7503-0685-0 (ISBN)
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D Williams, R Shimizu
Coverage includes: Overview of microanalytical techniques; Interactions of electron and photons with matter; Monte Carlo simulation: a tool to understand practical problems; Analytical electron microscopy; Recent developments in Auger electron spectroscopy and microscopy; Quantification procedures in EPMA; Analysis of thin surface layers and multilayers by EPMA; Standardless quantitative analysis; Image processing and microscopy; Quantification of X-ray spectra; Analysis of ultra-light elements by EPMA; Sample preparation; Applications of energy dispersive spectrometry in materails science; Difficulties in microprobe analysis; Applications of electron energy loss spectroscopy; X-ray emission valence band spectrometry; Radiation damage and charging effects in SEM, EPMA and related techniques; Electron spectroscopy: principles and applications; Future applications.
| Erscheint lt. Verlag | 1.1.2000 |
|---|---|
| Reihe/Serie | Institute of Physics Conference Series |
| Verlagsort | London |
| Sprache | englisch |
| Maße | 156 x 234 mm |
| Gewicht | 1020 g |
| Themenwelt | Naturwissenschaften ► Biologie |
| Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
| ISBN-10 | 0-7503-0685-8 / 0750306858 |
| ISBN-13 | 978-0-7503-0685-0 / 9780750306850 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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