Electron Microscopy and Analysis 2001

Buch | Hardcover

529 Seiten

2001
Institute of Physics Publishing (Verlag)
978-0-7503-0812-0 (ISBN)

Titel z.Zt. nicht lieferbar
Versandkostenfrei
Auch auf Rechnung

Artikel merken

Electron microscopy is a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. This book presents a useful snapshot of the developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies.

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.

M. Aindow. C.J. Kiely, Dept of Engineering, University of Liverpool, UK.

Preface Plenary Lectures HREM and Electron Crystallography Advanced SEM and Surface Science New Instrumentation, Imaging, and Analysis Ferrous Metals and Intermetallics Advanced Microanalysis and Elemental Imaging Carbons, Ceramics, and Composites Microscopy of Interfaces and Surfaces Catalysts, Sensors, and Environmental Materials Semiconductors, Superconductors, and Magnetic Materials Scanning Probe Microscopy Author Index Subject Index

Erscheint lt. Verlag	1.12.2001
Reihe/Serie	Institute of Physics Conference Series
Verlagsort	London
Sprache	englisch
Maße	156 x 234 mm
Gewicht	929 g
Themenwelt	Naturwissenschaften
ISBN-10	0-7503-0812-5 / 0750308125
ISBN-13	978-0-7503-0812-0 / 9780750308120
Zustand	Neuware