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Scanning Tunneling Microscopy II -

Scanning Tunneling Microscopy II

Further Applications and Related Scanning Techniques
Buch | Softcover
XIV, 308 Seiten
2012
Springer Berlin (Verlag)
978-3-642-97365-9 (ISBN)
CHF 74,85 inkl. MwSt
Scanning Tunneling Microscopy II, like its predecessor,
presents detailed and comprehensive accounts of the basic
principles and broad range of applications of STM and
related scanning probe techniques. The applications
discussed in this volume come predominantly from the fields
of electrochemistry and biology. In contrast to those
described in Vol. I, these sudies may be performed in air
and in liquids. The extensions of the basic technique to
map other interactions are described inchapters on scanning
force microscopy, magnetic force microscopy, scanning
near-field optical microscopy, together with a survey of
other related techniques. Also described here is the use of
a scanning proximal probe for surface modification.
Togehter, the two volumes give a comprehensive account of
experimental aspcets of STM. They provide essentialreading
and reference material for all students and researchers
involvedin this field.

Scanning tunneling microscopy is a fascinating imaging technique that can produce stunning pictures of both inanimate and biological materials. This book is the second of three volumes that together provide the first ever comprehensive introduction to, and review of, this important and rapidly expanding field.

1. Introduction.- 1.1 STM in Electrochemistry and Biology.- 1.2 Probing Small Forces on a Small Scale.- 1.3 Related Scanning Probe Microscopies.- 1.4 Nanotechnology.- References.- 2. STM in Electrochemistry.- 2.1 Principal Aspects.- 2.2 Experimental Concepts for Electrolytic STM at Potential-Controlled Electrodes.- 2.3 Electrochemical Applications of In Situ STM at Potential-Controlled Electrodes.- 2.4 Outlook.- References.- 3. The Scanning Tunneling Microscope in Biology.- 3.1 Instrumentation.- 3.2 Processing of STM Images.- 3.3 Preparation.- 3.4 Applications.- 3.5 Imaging and Conduction Mechanisms.- 3.6 Conclusions.- References.- 4. Scanning Force Microscopy (SFM).- 4.1 Experimental Aspects of Force Microscopy.- 4.2 Forces and Their Relevance to Force Microscopy.- 4.3 Microscopic Description of the Tip-Sample Contact.- 4.4 Imaging with the Force Microscope.- 4.5 Conclusions and Outlook.- References.- 5. Magnetic Force Microscopy (MFM).- 5.1 Basic Principles of MFM.- 5.2 Measurement Techniques.- 5.3 Force Sensors.- 5.4 Theory of MFM Response.- 5.5 Imaging Data Storage Media.- 5.6 Imaging Soft Magnetic Materials.- 5.7 Resolution.- 5.8 Separation of Magnetic and Topographic Signals.- 5.9 Comparison with Other Magnetic Imaging Techniques.- 5.10 Conclusions and Outlook.- References.- 6. Related Scanning Techniques.- 6.1 Historical Background.- 6.2 STM and Electrical Measurements.- 6.3 STM and Optical Effects.- 6.4 Near-Field Thermal Microscopy.- 6.5 Scanning Force Microscopy and Extensions.- 6.6 Conclusion.- References.- 7. Nano-optics and Scanning Near-Field Optical Microscopy.- 7.1 Nano-optics: Optics of Nanometer-Size Structures.- 7.2 Experimental Work.- 7.3 Plasmons and Spectroscopic Effects.- 7.4 Imaging by SNOM.- 7.5 Discussion, Outlook, Conclusions.- References.-8. Surface Modification with a Scanning Proximity Probe Microscope.- 8.1 Overview.- 8.2 Microfabrication with a Scanning Probe Microscope.- 8.3 Investigation of the Fabrication Process.- 8.4 Review of SXM Lithography.- References.

Erscheint lt. Verlag 12.2.2012
Reihe/Serie Springer Series in Surface Sciences
Co-Autor W. Baumeister, P. Grütter, R. Guckenberger, Hans-Joachim Güntherodt, T. Hartmann, H. Heinzelmann, H.J. Mamin, E. Meyer, D.W. Pohl, D. Rugar, H. Siegenthaler, U. Staufer, H.K. Wickramasinghe, W. Wiegräbe, Roland Wiesendanger
Zusatzinfo XIV, 308 p.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 492 g
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Schlagworte Chemistry • nanotechnology • Scanning Probe Microscopies • Scanning Tunneling Microscopy • Surface Science
ISBN-10 3-642-97365-5 / 3642973655
ISBN-13 978-3-642-97365-9 / 9783642973659
Zustand Neuware
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