Practical Guide to Surface Science and Spectroscopy (eBook)

Yip-Wah Chung (Autor)

eBook Download: PDF

2012 | 1. Auflage
160 Seiten
Elsevier Science (Verlag)
9780080497785 (ISBN)

Infos

Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces. These techniques include auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy electron diffraction, scanning probe microscopy, and interfacial segregation. Understanding the behavior of materials at their surfaces is essential for materials scientists and engineers as they design and fabricate microelectronics and semiconductor devices.

The book gives over 100 examples, discussion questions and problems with varying levels of difficulty. Included with this book is a CD-ROM, which not only contains the same information, but also provides many elements of animation and interaction that are not easily emulated on paper. In diverse subject matters ranging from the operation of ion pumps, computer-assisted data acquisition to tapping mode atomic force microscopy, the interactive component is especially helpful in conveying difficult concepts and retention of important information. The succinct style and organization of this practical guide is ideal for anyone who wants to get up to speed on a given topic in surface spectroscopy or phenomenon within a reasonable amount of time.

Key Features
* Both theory and practice are emphasized
* Logical organization allows one to get up to speed on any given topic quickly
* Numerous examples, questions for discussion and practice problems are included
* The CD includes animation and interactive elements that help to convey difficult concepts

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Practical Guide to Surface Science and Spectroscopy provides a practical introduction to surface science as well as describes the basic analytical techniques that researchers use to understand what occurs at the surfaces of materials and at their interfaces. These techniques include auger electron spectroscopy, photoelectron spectroscopy, inelastic scattering of electrons and ions, low energy electron diffraction, scanning probe microscopy, and interfacial segregation. Understanding the behavior of materials at their surfaces is essential for materials scientists and engineers as they design and fabricate microelectronics and semiconductor devices. The book gives over 100 examples, discussion questions and problems with varying levels of difficulty. Included with this book is a CD-ROM, which not only contains the same information, but also provides many elements of animation and interaction that are not easily emulated on paper. In diverse subject matters ranging from the operation of ion pumps, computer-assisted data acquisition to tapping mode atomic force microscopy, the interactive component is especially helpful in conveying difficult concepts and retention of important information. The succinct style and organization of this practical guide is ideal for anyone who wants to get up to speed on a given topic in surface spectroscopy or phenomenon within a reasonable amount of time. - Both theory and practice are emphasized- Logical organization allows one to get up to speed on any given topic quickly- Numerous examples, questions for discussion and practice problems are included- The CD includes animation and interactive elements that help to convey difficult concepts

Inhalt

Cover 1
Contents 6
Preface 12
Chapter 1. Fundamental Concepts in Ultrahigh Vacuum, Surface Preparation, and Electron Spectroscopy 15
1.1 Introduction 15
1.2 The Need for Ultrahigh Vacuum 16
1.3 Achieving Ultrahigh Vacuum 18
1.4 Pressure Measurement 21
1.5 Preparation of Clean Surfaces 23
1.6 Need for Electron Spectroscopy 24
1.7 Electron Scattering from Solid Surfaces 26
1.8 Electron Energy Analyzers 27
1.9 Other Considerations 33
Problems 33
Chapter 2. Auger Electron Spectroscopy 37
2.1 Auger Electron Emission 37
2.2 Experimental Aspects 38
2.3 Sensitivity of Auger Electron Spectroscopy 40
2.4 Energies and Shapes of Auger Peaks 41
2.5 Chemical State Effects 42
2.6 Intensity of Auger Electron Emission 43
2.7 Profile Analysis 47
2.8 Scanning Auger Microprobe 47
2.9 Quantitative Analysis 49
2.10 Case Study: Surface Composition of a 5 at% Al–Fe Alloy 53
Problems 54
Chapter 3. Photoelectron Spectroscopy 59
3.1 One-Electron Description of the Photoelectric Effect 59
3.2 Photon Sources 61
3.3 Detectors 64
3.4 Element Identification 65
3.5 Chemical Shift 65
3.6 Relaxation Shift and Multiplet Splitting 67
3.7 Chemical Bonding on Surfaces 68
3.8 Band Structure Studies 70
3.9 Extended X-Ray Absorption Fine Structure 74
3.10 Special Applications 76
Problems 78
Chapter 4. Inelastic Scattering of Electrons and Ions 83
4.1 One-Electron Excitation of Core and Valence Electrons 83
4.2 Plasmon Excitations 85
4.3 Surface Vibrations 86
4.4 Ion Scattering Spectroscopy 89
4.5 Secondary Ion Mass Spectrometry 91
Problems 94
Chapter 5. Low-Energy Electron Diffraction 97
5.1 Introduction 97
5.2 Electron Diffraction 97
5.3 Naming Conventions for Surface Structures 99
5.4 Experimental Aspects 101
5.5 Selected Properties of the Surface Reciprocal Space 102
5.6 Kinematic Theory 103
5.7 Applications of the Kinematic Theory 106
Problems 111
Appendix Diffraction Intensity as a Function of Temperature 112
Chapter 6. Scanning Probe Microscopy 115
6.1 Introduction 115
6.2 Historical Perspective 116
6.3 Review of Electron Tunneling 117
6.4 Principle of STM Imaging 118
6.5 STM Image Interpretation 120
6.6 STM Implementation 121
6.7 Applications of STM 126
6.8 Limitations of STM and Solutions 128
6.9 Scanning Capacitance Microscopy 129
6.10 Atomic Force Microscopy 129
Problems 130
Additional Reading 131
Chapter 7. Interfacial Segregation 133
7.1 Introduction 133
7.2 Gibbs Adsorption Equation 133
7.3 One Component Systems 137
7.4 Surface Segregation in Binary Alloys 138
7.5 Relationship Between Surface and Bulk Composition of Binary Alloys 141
7.6 The Unified Segregation Model 143
7.7 Environmental Effects on Surface Segregation 145
Problems 147
Chapter 8. Metal–Semiconductor Interfaces 151
8.1 Surface States 151
8.2 Semiconductor Surfaces 155
8.3 Work Function Measurements 160
8.4 The Metal–Semiconductor Interface 162
Problems 167
Appendix Useful Information for Semiconductors 170
Chapter 9. Gas–Surface Interactions 171
9.1 Introduction 171
9.2 Heat of Adsorption 173
9.3 The Langmuir Adsorption Isotherm 181
9.4 Pressure Effects 186
9.5 Promoters, Poisons, and Ensemble Effects 186
9.6 Surface Compounds 187
9.7 Case Studies 188
Problems 192
Index 195

Produkt-Details

• Erscheint lt. Verlag: 2.12.2012
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Chemie ► Analytische Chemie
• Themenwelt: Naturwissenschaften ► Chemie ► Physikalische Chemie
• Themenwelt: Technik ► Maschinenbau
• ISBN-13: 9780080497785 / 9780080497785