Atomic Force Microscopy/Scanning Tunneling Microscopy 3 (eBook)

Samuel H. Cohen, Marcia L. Lightbody (Herausgeber)

eBook Download: PDF

2007 | 1. Auflage
218 Seiten
Springer US (Verlag)
978-0-306-47095-0 (ISBN)

Infos

The editors have done a fine job assembling a variety of contributions of varied style, topics, and current relevance into a coherent whole. The quality of the images, typesetting are all excellent and the book is organized in a thoughtful way.

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The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day's sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.

Inhalt

PREFACE 5
CONTENTS 7
A PRACTICAL APPROACH TO UNDERSTANDING SURFACE METROLOGY AND ITS APPLICATIONS 9
INTRODUCTION 9
SCALES OF INTERACTION – GENERAL AND FUNDAMENTAL 10
SCALES OF INTERACTION IN MEASUREMENT 11
SCALES OF INTERACTION IN CONVENTIONAL ANALYSIS 12
SCALE- SENSITIVE GEOMETRIC PROPERTIES AND FRACTAL ANALYSIS 14
THE SELECTION OF ANALYSISMETHODS AND CHARACTERIZATION PARAMETERS 15
INFORMATION CONTENT 16
CONCLUDING REMARKS 17
Acknowledgments 17
REFERENCES 17
APPLICATIONS OF SCANNING PROBE MICROSCOPY IN MATERIALS SCIENCE: EXAMPLES OF SURFACE MODIFICATION AND QUANTITATIVE ANALYSIS 19
INTRODUCTION 19
MATERIALS AND METHODS 20
EXAMPLES OF MODIFICATION AND STRUCTURING OF SUFACES 20
EXAMPLES OF QUANTITATIVE ANALYSES OF SURFACE TOPOGRAPHY 22
DISCUSSION: PROBLEMS AND PERSPECTIVES 35
Acknowledgments 35
REFERENCES 36
SCANNING PROBE MICROSCOPY IN BIOLOGY WITH POTENTIAL APPLICATIONS IN FORENSICS 38
INTRODUCTION 38
PROBES 39
ARTIFACTS AND RESOLUTION 40
Other Nucleo-Protein Systems 45
SUMMARY 53
Acknowledgments 53
REFERENCES 54
ATOMIC MANIPULATION OF HYDROGEN ON HYDROGEN-TERMINATED SILICON SURFACES WITH SCANNING TUNNELING MICROSCOPE 56
INTRODUCTION 56
MATERIALS AND METHODS 57
Si( 100)- 2 x 1 Surface Preparation 57
Hydrogen- Terminated Silicon Surfaces 58
RESULTS AND DISCUSSIONS Hydrogen Extraction from the Si( 100)- 2 x 1: H Surface 60
Hydrogen Deposition onto the Si( 100)- 2 x 1: H Surface 65
CONCLUSIONS 68
ACKNOWLEDGMENTS 69
REFERENCES 70
APOLLO 11 LUNAR SAMPLES: AN EXAMINATION USING TAPPING MODE ATOMIC FORCE MICROSCOPY AND OTHER MICROSCOPIC METHODS 72
INTRODUCTION 72
MATERIALS AND METHODS 73
RESULTS AND DISCUSSION 74
CONCLUSION 76
REFERENCE 80
NOVEL MICROMACHINED CANTILEVER SENSORS FOR SCANNING NEAR-FIELD MICROSCOPY 81
INTRODUCTION 81
NEAR-FIELD SENSOR TECHNOLOGY 82
EXPERIMENTAL SET-UP 83
RESULTS 85
CONCLUSION 87
Acknowledgment 87
REFERENCES 87
IMAGING OF CELL SURFACE STRUCTURE BY SCANNING PROBE MICROSCOPY 88
INTRODUCTION AND EXPERIMENTAL 88
RESULTS AND DISCUSSION 89
CONCLUSION 91
REFERENCES 91
A FORCE LIMITATION FOR SUCCESSFUL OBSERVATION OF ATOMIC DEFECTS: DEFECT TRAPPING OF THE ATOMIC FORCE MICROSCOPY TIP 92
INTRODUCTION 92
Model for the Simulations 93
RESULTS AND DISCUSSION 95
CONCLUSIONS 99
REFERENCES 99
A NEW APPROACH TO EXAMINE INTERFACIAL INTERACTION POTENTIAL BETWEEN A THIN SOLID FILM OR A DROPLET AND A SMOOTH SUBSTRATE 101
INTRODUCTION 101
EXPERIMENTAL 102
RESULTS AND DISCUSSION 103
I. Sublimation Rate ofMicron-Sized TNT on Silica Surface Ia. Tapping Mode AFM Study of a Thin Solid TNT Film on a Silica Surface 104
Ib. Model Consideration 106
11. Evaporation of TNT Liquid Droplets on Silica Surface 110
IIa. AFM Images Of Explosive Droplets On Silica Surfaces 111
IIb. A Model Consideration 113
CONCLUSION 115
ACKNOWLEDGMENTS 115
REFERENCES 115
NANOMETER-SCALE PATTERNING OF SURFACES USING SELF-ASSEMBLY CHEMISTRY. 1. PRELIMINARY STUDIES OF POLYANILINE ELECTRODEPOSITION ON SELF-ASSEMBLED MIXED MONOLAYERS 116
INTRODUCTION 116
EXPERIMENTAL 117
RESULTS AND DISCUSSION 118
CONCLUSION 122
Acknowledgment 122
REFERENCES 122
LOCAL RATE OF ELECTROLESS COPPER DEPOSITION BY SCANNING TUNNELING MICROSCOPY 124
INTRODUCTION 124
EXPERIMENTAL 125
RESULTS 126
Acknowledgments 126
REFERENCES 126
ATOMIC FORCE MICROSCOPY OF OLIVINE 127
INTRODUCTION 127
MATERIALS AND METHODS 128
RESULTS AND DISCUSSION 129
SUMMARY 134
Acknowledgments 136
REFERENCES 136
THE STUDY OF SUBLIMATION RATES AND NUCLEATION AND GROWTH OF TNT AND PETN ON SILICA AND GRAPHITE SURFACES BY OPTICAL AND ATOMIC FORCE MICROSCOPY AND ELLIPSOMETRY 137
INTRODUCTION 138
EXPERIMENTAL 139
Optical and Atomic Force Microscopy and Ellipsometry 140
RESULTS AND DISCUSSION 140
Characterization of Deposited TNT and PETN on Silica Surfaces 140
SUBLIMATION RATES OF TNT FROM SILICA, MICA, AND GRAPHITE SURFACES 148
Comparison of TNT Sublimation Rates on Three Different Surfaces 151
Effective Sublimation Rate Measured By Ellipsometry 151
CONCLUSION 152
Acknowledgment 153
REFERENCES 154
PECULIARITIES OF THE SCANNING TUNNELING MICROSCOPY PROBE ON POROUS GALLIUM PHOSPHIDE 155
INTRODUCTION 155
EXPERIMENTAL 156
RESULTS AND DISCUSSIONS 156
STM Tip Shape Effect 157
“Error Budget” of the Tip Shape Effect 159
Lateral Effect 160
Tip Bending 162
Image Processing 166
CONCLUSIONS 168
Acknowledgments 168
REFERENCES 168
APPENDIX 169
INFLUENCE OF DOPING CONCENTRATION ON THE ETCHING RATE OF GaAs STUDIED BY ATOMIC FORCE MICROSCOPY 170
INTRODUCTION 170
METHODS 171
Acknowledgment 174
REFERENCES 174
COMPARATIVE SCANNING TUNNELING MICROSCOPY STUDIES OF CoFe2O4 NANOPARTICLES OF FERROFLUIDS IN ACIDIC MEDIUM 175
INTRODUCTION 175
MATERIALS AND METHODS 176
EXPERIMENTAL RESULTS 176
DISCUSSION 178
REFERENCES 179
FROM LABORATORY MEASUREMENTS TO THE FIRST IN-SITU ANALYSIS OF PRISTINE COMETARY GRAINS 180
INTRODUCTION 181
TECHNICAL DESCRIPTION OF MIDAS 182
Capabilities of the Microscope 182
The Collection and Transport System 183
Microvibration 183
AFM Measurements 184
Cosmic Spherules 184
OBSERVATIONS 185
DISCUSSION 185
Acknowledgment 187
REFERENCES 187
SYNTHESIS OF PREBIOTIC PEPTIDES AND OLIGONUCLEOTIDES ON CLAY MINERAL SURFACES: A SCANNING FORCE MICROSCOPY STUDY 188
INTRODUCTION 188
MATERIALS AND METHODS 189
RESULTS AND DISCUSSION 190
CONCLUSIONS 193
Acknowledgments 194
REFERENCES 194
SURFACE STRUCTURE AND INTERCALATIVE POLYMERIZATION STUDIES OF SMECTITE CLAY THIN FILMS 196
INTRODUCTION 196
MATERIALS AND METHOD 197
RESULTS AND DISCUSSION 197
CONCLUSION 201
Acknowledgments 202
REFERENCES 202
ATOMIC FORCE MICROSCOPY - A NEW AND COMPLEMENTARY TOOL IN ASPHALT RESEARCH COMPARED TO SCANNING ELECTRON MICROSCOPY 203
INTRODUCTION 203
REFERENCES 206
Index 207

Textauszug

APPLICATIONS OF SCANNING PROBE MICROSCOPY IN MATERIALS SCIENCE: EXAMPLES OF SURFACE MODIFICATION AND QUANTITATIVE ANALYSIS (p. 11-12)

Peter von Blanckenhagen
Forschungszentrum Karlsruhe
Institut für Nanotechnologie
Postfach 3640, D-76021
Karlsruhe, Germany

Abstract. An overview is presented of some applications of scanning tunneling and scanning force microscopy, which indicate capabilities to research and development in nanotechnology. Results are reported of studies of surface modifications by local material deposition (A1, Au) and by mechanical material removal (Au), and of studies of surface selfdiffusion (Au), cluster dynamics (Au), thermal stability of semiconducting quantum dots (In5A15Ga), metallic multilayers (Fe/Mo), nanocrystalline materials (Au), Al-island formation on Si (1 1 1) surfaces and, finally, of cluster size distribution as well as distance dependence of tip-sample interactions for A12O3 and Fe2O3 clusters.

INTRODUCTION

In recent years, scanning probe microscopy (SPM) has become an important tool in materials science. It not only allows ultimate analyses of surface structures to be conducted, but also unique procedures to be performed, such as material deposition, initiation of chemical reactions (e.g. oxidation, lithographic reactions), mechanical structuring as well as manipulation of atoms, molecules, and clusters.1,2 Phenomena of practical importance, such as friction,3,4 adhesion5, local magnetism,6,7and surface diffusion8 can be studied on a microscopic scale. Several special types of instruments are now available for surface modification and for studying the surface properties of materials.9,10,11 Among other methods of interest in materials science are electrolytic SPM techniques,12 and SPM techniques using magnetic13 and optical14 sensors.

Descriptions of surface topography were the main objective of earlier studies of scanning probe microscopy. In the past few years, however, more and more quantitative analyses have been performed by means of scanning probe microscopes.

In this overview, results will be discussed of nine cases of surface modification and quantitative analysis by scanning tunneling (STM) and scanning force microscopes (SFM, AFM). SPM has a considerable impact now on research and development in micro- and nanotechnology. Scanning force microscopes have become important tools for controlling the topography of electronic chips in the production process, and for analysis of the topography of micromechanical components. One of the most promising applications of scanning probe microscopy is in the elucidation of the fundamentals of future nanotechnology. In nanotechnology, materials science and solid state physics on an atomic scale should meet. Also studies of chemical and biological nanosystems will contribute to the fundamentals of future nanotechnology. Two aspects are of special interest: Firstly, the self-organization processes occurring in nature and secondly, the creation of nanosystems by surface modification and by manipulation of atoms, molecules or clusters, and the characterization of such artificial systems. It is worthwhile studying biological molecular systems, such as motors, sieves, and electrical conductors, to find ways of designing nanosystems for practical use. A review is presented below of the findings made in various subjects of potential interest in nanotechnology, which were studied at our laboratory over the past few years by scanning tunneling and scanning force microscopy.

MATERIALS AND METHODS

Local material deposition was performed with the UHV-STM supplied by Perkin-Elmer, which is operated by a Nanoscope III controller. The silicon surfaces were cleaned by flashing samples to 1250° C by direct current heating. The tunneling tips were produced by mechanical cutting in air of Au or A1 wires 0.25 mm thick. The materials used for SFM studies in air must be stable in air. In most cases, Au samples were used for exploratory studies to minimize the influence of the atmosphere. The samples were examined under a commercial atomic force microscope (Multimode SPM with Nanoscope IIIA controller) in the contact mode or the tapping mode of operation. In some cases, the chemical composition of surfaces was analyzed by Auger electron spectroscopy (AES).

Produkt-Details

• Erscheint lt. Verlag: 8.5.2007
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Chemie ► Analytische Chemie
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-306-47095-0 / 0306470950
• ISBN-13: 978-0-306-47095-0 / 9780306470950