Innovative Technological Materials

Structural Properties by Neutron Scattering, Synchrotron Radiation and Modeling

Jacek J. Skrzypek, Franco Rustichelli (Herausgeber)

Buch | Hardcover

XXII, 279 Seiten

2010
Springer Berlin (Verlag)
978-3-642-12058-9 (ISBN)

Infos

This book provides at first ideas on the answers that neutrons and Synchrotron Radiation could give in innovative materials science and technology. In particular, non-conventional, unusual or innovative neutron and x-ray scattering experiments (from both the scientific and the instrumental point of view) will be described which either have novel applications or provide a new insight into material science and technology. Moreover, a capability of the existing and the enhanced constitutive models and numerical procedures to predict complex behaviour of the novel multifunctional materials is examined.

Inhalt

and State-of-the-Art.- X-ray and Neutron Scattering.- Microstructural Investigations by Small Angle Scattering of Neutrons and X-rays.- Residual Stress Analysis by Neutron and X-ray Diffraction.- Three-Dimensional Imaging by Microtomography of X-ray Synchrotron Radiation and Neutrons.- Constitutive Models for Analysis and Design of Multifunctional Technological Materials.- Enhanced Numerical Tools for Computer Simulation of Coupled Physical Phenomena and Design of Components Made of Innovative Materials.

Produkt-Details

• Erscheint lt. Verlag: 6.5.2010
• Zusatzinfo: XXII, 279 p.
• Verlagsort: Berlin
• Sprache: englisch
• Maße: 155 x 235 mm
• Gewicht: 1330 g
• Themenwelt: Naturwissenschaften ► Chemie ► Analytische Chemie
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
• Schlagworte: diffraction • Material properties • Microtomography • Modeling • neutron diffraction • neutron scattering • Stress • Synchroton radiation • X-ray scattering
• ISBN-10: 3-642-12058-X / 364212058X
• ISBN-13: 978-3-642-12058-9 / 9783642120589
• Zustand: Neuware