Modern Statistical And Mathematical Methods In Reliability
Seiten
2005
World Scientific Publishing Co Pte Ltd (Verlag)
9789812563569 (ISBN)
World Scientific Publishing Co Pte Ltd (Verlag)
9789812563569 (ISBN)
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Contains 28 papers presented at The Fourth International Conference on Mathematical Methods in Reliability in New Mexico, held in 2004. This volume provides coverage on reliability modelling, network and system reliability, Bayesian methods, survival analysis, degradation and maintenance modelling, and software reliability.
This volume contains extended versions of 28 carefully selected and reviewed papers presented at The Fourth International Conference on Mathematical Methods in Reliability in Santa Fe, New Mexico, June 21-25, 2004, the leading conference in reliability research. The meeting serves as a forum for discussing fundamental issues on mathematical methods in reliability theory and its applications.A broad overview of current research activities in reliability theory and its applications is provided with coverage on reliability modeling, network and system reliability, Bayesian methods, survival analysis, degradation and maintenance modeling, and software reliability. The contributors are all leading experts in the field and include the plenary session speakers, Tim Bedford, Thierry Duchesne, Henry Wynn, Vicki Bier, Edsel Pena, Michael Hamada, and Todd Graves.
This volume contains extended versions of 28 carefully selected and reviewed papers presented at The Fourth International Conference on Mathematical Methods in Reliability in Santa Fe, New Mexico, June 21-25, 2004, the leading conference in reliability research. The meeting serves as a forum for discussing fundamental issues on mathematical methods in reliability theory and its applications.A broad overview of current research activities in reliability theory and its applications is provided with coverage on reliability modeling, network and system reliability, Bayesian methods, survival analysis, degradation and maintenance modeling, and software reliability. The contributors are all leading experts in the field and include the plenary session speakers, Tim Bedford, Thierry Duchesne, Henry Wynn, Vicki Bier, Edsel Pena, Michael Hamada, and Todd Graves.
# Competing Risk Modeling in Reliability (T Bedford) # Game-Theoretic and Reliability Methods in Counter-Terrorism and Security (V Bier) # Regression Models for Reliability Given the Usage Accumulation History (T Duchesne) # Bayesian Methods for Assessing System Reliability: Models and Computation (T Graves & M Hamada) # Dynamic Modeling in Reliability and Survival Analysis (E A Pena & E Slate) # End of Life Analysis (H Wynn et al.) # and other papers
| Erscheint lt. Verlag | 4.10.2005 |
|---|---|
| Reihe/Serie | Series on Quality, Reliability and Engineering Statistics ; 10 |
| Verlagsort | Singapore |
| Sprache | englisch |
| Themenwelt | Mathematik / Informatik ► Mathematik ► Statistik |
| ISBN-13 | 9789812563569 / 9789812563569 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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