Machine Learning Support for Fault Diagnosis of System-on-Chip (eBook)

Patrick Girard, Shawn Blanton, Li-C. Wang (Herausgeber)

eBook Download: PDF

2023
316 Seiten
Springer International Publishing (Verlag)
978-3-031-19639-3 (ISBN)

Infos

This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.

Produkt-Details

• Erscheint lt. Verlag: 13.3.2023
• Zusatzinfo: XI, 316 p. 165 illus.
• Sprache: englisch
• Themenwelt: Mathematik / Informatik ► Informatik
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Schlagworte: Intelligent VLSI Test Engineering • Intelligent Yield Optimization • Machine Learning in Design and Test • Smart Analytics for semiconductor design and test • VLSI Design for Machine Learning
• ISBN-10: 3-031-19639-2 / 3031196392
• ISBN-13: 978-3-031-19639-3 / 9783031196393