Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings

Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly (Herausgeber)

Buch | Softcover

XII, 378 Seiten

2021 | 1st ed. 2021
Springer International Publishing (Verlag)
9783030739720 (ISBN)

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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.

The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.

The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

Classification and data processing.- Deep learning.- Graph-theoretic methods.- Multimedia analysis and understanding.

Erscheinungsdatum	12.04.2021
Reihe/Serie	Image Processing, Computer Vision, Pattern Recognition, and Graphics
Reihe/Serie	Lecture Notes in Computer Science
Zusatzinfo	XII, 378 p. 103 illus., 84 illus. in color.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Gewicht	599 g
Themenwelt	Informatik ► Theorie / Studium ► Künstliche Intelligenz / Robotik
Schlagworte	Algorithm analysis and problem complexity • Artificial Intelligence • Computer Networks • Computer Science • Computer systems • computer vision • Directed graphs • Education • Engineering • graph theory • Image Analysis • Image Processing • Image Segmentation • Internet • learning • machine learning • Mathematics • Neural networks • pattern recognition • Signal Processing • statistical pattern recognition • structural pattern recognition • supervised learning • theoretical computer science
ISBN-13	9783030739720 / 9783030739720
Zustand	Neuware