Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing
Springer International Publishing (Verlag)
978-3-030-08745-6 (ISBN)
This book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs.
- Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research
- Describes in detail advanced techniques to harden circuits against ionizing radiation
- Provides a practical way to learn and understand radiation effects in time-based circuits
- Includes an introduction to the underlying physics, circuitdesign, and advanced techniques accompanied with experimental data
Dr. Jeffrey Prinzie received is M.Sc. degree and PhD degree from KU Leuven in 2013 and 2017 respectively. He worked as a PhD researcher in the field of radiation tolerant integrated circuits with the ADVISE research group. His main interest goes to the hardening of time-based mixed-signal and RF circuits, especially PLLs and TDCs and radiation sensors. He gained experience in the design and experimental testing of these circuits in nuclear facilities. During his PhD, he was part of the CERN micro-electronics research group in which he is collaborating on a TDC SoC and high speed multi-gigabit transceiver.
Introduction.- Radiation Effects in CMOS Technology.- Time-Domain Signal Processing.- Clock Synthesizers.- Single Shot Time-to-Digital Converters.- Low Jitter Clock Generators.- Radiation experiments on CMOS PLLs.- Radiation Hard Frequency Synthesizers.- Conclusion.
| Erscheinungsdatum | 21.01.2019 |
|---|---|
| Reihe/Serie | Analog Circuits and Signal Processing |
| Zusatzinfo | XXV, 183 p. 150 illus., 17 illus. in color. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 332 g |
| Themenwelt | Mathematik / Informatik ► Informatik |
| Technik ► Elektrotechnik / Energietechnik | |
| Schlagworte | Fault-Tolerant Design • Radiation Effects in CMOS • Radiation-hardened circuits • Radiation-Tolerant Circuits • Soft Errors |
| ISBN-10 | 3-030-08745-X / 303008745X |
| ISBN-13 | 978-3-030-08745-6 / 9783030087456 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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