New Trends in Parameter Identification for Mathematical Models
Springer International Publishing (Verlag)
978-3-319-70823-2 (ISBN)
Posterior contraction in Bayesian inverse problems under Gaussian priors.- Convex regularization of discrete-valued inverse problems.- Algebraic reconstruction of source and attenuation in SPECT using first scattering measurements.- On l1-regularization under continuity of the forward operator in weaker topologies.- On self-regularization of ill-posed problems in Banach spaces by projection methods.- Monotonicity-based regularization for phantom experiment data in electrical impedance tomography.- An SVD in Spherical Surface Wave Tomography.- Numerical Studies of Recovery Chances for a Simplified EIT Problem.- Bayesian updating in the determination of forces in Euler-Bernoulli beams.- On nonstationary iterated Tikhonov methods for ill posed equation in Banach spaces.- The product midpoint rule for Abel-type integral equations of the first kind with perturbed data.- Heuristic parameter choice in Tikhonov method form minimizers of the quasi-optimality function.- Modification of Iterative Tikhonov Regularization Motivated by a Problem of Identification of Laser Beam Quality Parameters.- Tomographic terahertz imaging using sequential subspace optimization.- Adaptivity and Oracle Inequalities in Linear Statistical Inverse Problems: a (numerical) survey.- Relaxing Alternating Direction Method of Multipliers (ADMM) algorithm for linear inverse problems.
| Erscheinungsdatum | 03.03.2018 |
|---|---|
| Reihe/Serie | Trends in Mathematics |
| Zusatzinfo | VIII, 338 p. 107 illus., 99 illus. in color. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 654 g |
| Themenwelt | Mathematik / Informatik ► Mathematik ► Analysis |
| Schlagworte | Bayesian approach • ill-posed problems • integral equations of the first kind • Inverse Problems • parameter identification • partial differential equations • Partial differential equations • Regularization • statistical regularization • Tomography |
| ISBN-10 | 3-319-70823-6 / 3319708236 |
| ISBN-13 | 978-3-319-70823-2 / 9783319708232 |
| Zustand | Neuware |
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